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Volumn 14, Issue 2, 2004, Pages 445-463

The effects of space radiation exposure on power MOSFETS: A review

Author keywords

MOSFETS; Power MOSFETS; Radiation effects; Space radiation; VDMOS

Indexed keywords

ELECTRIC POTENTIAL; ELECTRON TRANSITIONS; FIELD EFFECT TRANSISTORS; MOS CAPACITORS; RADIATION EFFECTS;

EID: 8444237096     PISSN: 01291564     EISSN: None     Source Type: Journal    
DOI: 10.1142/S0129156404002454     Document Type: Review
Times cited : (15)

References (56)
  • 2
    • 0024104046 scopus 로고
    • The space radiation environment for electronics
    • E.G. Stassinopolous and J.P Raymond, "The Space Radiation Environment for Electronics," Proc. IEEE 76 (1988) 1423-1442.
    • (1988) Proc. IEEE , vol.76 , pp. 1423-1442
    • Stassinopolous, E.G.1    Raymond, J.P.2
  • 3
    • 0020304245 scopus 로고
    • The natural radiation environment inside a spacecraft
    • J.H. Adams, Jr., "The Natural Radiation Environment Inside a Spacecraft," IEEE Trans. Nucl. Sci. 29 (1983) 2095-2100.
    • (1983) IEEE Trans. Nucl. Sci. , vol.29 , pp. 2095-2100
    • Adams Jr., J.H.1
  • 5
    • 0001520716 scopus 로고    scopus 로고
    • The future of power semiconductor device technology
    • B.J. Baliga, "The Future of Power Semiconductor Device Technology," Proc. IEEE 89 (2001) 822-832.
    • (2001) Proc. IEEE , vol.89 , pp. 822-832
    • Baliga, B.J.1
  • 9
    • 0003232234 scopus 로고    scopus 로고
    • A comparison of modern power device concepts for high voltage applications: Field stop-IGBT, compensation devices and SiC devices
    • G. Deboy, H. Hulsken, H. Mitlehner, and R. Rupp, "A Comparison of Modern Power Device Concepts for High Voltage Applications: Field Stop-IGBT, Compensation Devices and SiC Devices," Proc. Bipolar/BiCMOS Circuits and Technology Mtg. (2000) 134-141.
    • (2000) Proc. Bipolar/BiCMOS Circuits and Technology Mtg. , pp. 134-141
    • Deboy, G.1    Hulsken, H.2    Mitlehner, H.3    Rupp, R.4
  • 10
    • 0038642526 scopus 로고    scopus 로고
    • Significantly improved performance of MOSFETs on silicon carbide using the 15R-SiC polytype
    • R. Schomer, P. Friedrichs, D. Peters, and D. Stephani, "Significantly Improved Performance of MOSFETs on Silicon Carbide Using the 15R-SiC Polytype," IEEE Elect Dev. Lett 20 (1999) 241-244.
    • (1999) IEEE Elect Dev. Lett , vol.20 , pp. 241-244
    • Schomer, R.1    Friedrichs, P.2    Peters, D.3    Stephani, D.4
  • 14
    • 0036540124 scopus 로고    scopus 로고
    • Effects of hydrogen transport and reactions on microelectronics radiation response and reliability
    • D.M. Fleetwood, "Effects of Hydrogen Transport and Reactions on Microelectronics Radiation Response and Reliability," Microelectronics Reliability 42 (2002) 523-541.
    • (2002) Microelectronics Reliability , vol.42 , pp. 523-541
    • Fleetwood, D.M.1
  • 15
    • 0022600166 scopus 로고
    • Simple technique for separating the effects of interface traps and trapped-oxide charge in metal-oxide-semiconductor transistors
    • P.J. McWhorter and P.S. Winokur, "Simple Technique for Separating the Effects of Interface Traps and Trapped-Oxide Charge in Metal-Oxide-Semiconductor Transistors," Appl. Phys. Lett. 48 (1985) 133-135.
    • (1985) Appl. Phys. Lett. , vol.48 , pp. 133-135
    • McWhorter, P.J.1    Winokur, P.S.2
  • 16
    • 0025405045 scopus 로고
    • MOS device degradation due to total dose ionizing radiation in the natural space environment: A review
    • K.F. Galloway and R.D. Schrimpf, "MOS Device Degradation due to Total Dose Ionizing Radiation in the Natural Space Environment: A Review," Microelectronics J. 21 (1990) 67-81.
    • (1990) Microelectronics J. , vol.21 , pp. 67-81
    • Galloway, K.F.1    Schrimpf, R.D.2
  • 17
    • 0021609581 scopus 로고
    • Super recovery of total dose damage in MOS devices
    • A.H. Johnston, "Super Recovery of Total Dose Damage in MOS Devices," IEEE Trans. Nucl. Sci. 31 (1984) 1427-1433.
    • (1984) IEEE Trans. Nucl. Sci. , vol.31 , pp. 1427-1433
    • Johnston, A.H.1
  • 18
  • 19
    • 0023562596 scopus 로고
    • Total-dose failure mechanisms of integrated circuits in laboratory and space environments
    • P.S. Winokur, F.W. Sexton, G.L. Hash, D.C. Turpin, "Total-Dose Failure Mechanisms of Integrated Circuits in Laboratory and Space Environments," IEEE Trans. Nucl. Sci. 34 (1987) 1448-1454.
    • (1987) IEEE Trans. Nucl. Sci. , vol.34 , pp. 1448-1454
    • Winokur, P.S.1    Sexton, F.W.2    Hash, G.L.3    Turpin, D.C.4
  • 22
    • 0025462772 scopus 로고
    • Simulated space radiation effects on power MOSFETs in switching power supplies
    • P.J. Wahle, R.D. Schrimpf, and K.F. Galloway, "Simulated Space Radiation Effects on Power MOSFETs in Switching Power Supplies," IEEE Trans. Industry Appl. 26 (1990) 798-802.
    • (1990) IEEE Trans. Industry Appl. , vol.26 , pp. 798-802
    • Wahle, P.J.1    Schrimpf, R.D.2    Galloway, K.F.3
  • 23
    • 0021609193 scopus 로고
    • A simple model for separating interface and oxide charge effects in MOS device characteristics
    • K.F. Galloway, M. Gaitan, and T.J. Russell, "A Simple Model for Separating Interface and Oxide Charge Effects in MOS Device Characteristics," IEEE Trans. Nucl. Sci. 31 (1984) 1497-1501.
    • (1984) IEEE Trans. Nucl. Sci. , vol.31 , pp. 1497-1501
    • Galloway, K.F.1    Gaitan, M.2    Russell, T.J.3
  • 24
    • 0027886813 scopus 로고
    • Separation of effects of oxide-trapped charge and interface-trapped charge on mobility in irradiated power MOSFETs
    • D. Zupac, P. Khosropour, S. Anderson, R.D. Schrimpf, and K.F. Galloway, "Separation of Effects of Oxide-Trapped Charge and Interface-Trapped Charge on Mobility in Irradiated Power MOSFETs," IEEE Trans. Nucl. Sci. 40 (1993) 1307-1315.
    • (1993) IEEE Trans. Nucl. Sci. , vol.40 , pp. 1307-1315
    • Zupac, D.1    Khosropour, P.2    Anderson, S.3    Schrimpf, R.D.4    Galloway, K.F.5
  • 25
    • 84915608139 scopus 로고
    • Silicon power field controlled devices
    • (D. Kahng, ed.), Academic Press, New York
    • B. J. Baliga, "Silicon Power Field Controlled Devices," in: Silicon Integrated Circuits, Part B, (D. Kahng, ed.), Academic Press, New York, pp. 158-174, 1981.
    • (1981) Silicon Integrated Circuits, Part B , pp. 158-174
    • Baliga, B.J.1
  • 26
    • 0020193209 scopus 로고
    • High-voltage device termination techniques - A comparative review
    • B. J. Baliga, "High-Voltage Device Termination Techniques - A Comparative Review," IEE Proc. 129 (1982) 173-179.
    • (1982) IEE Proc. , vol.129 , pp. 173-179
    • Baliga, B.J.1
  • 28
    • 0020902952 scopus 로고
    • The effects of ionizing radiation on the breakdown voltage of power MOSFETs
    • D. L. Blackburn, J. M. Benedetto, and K. F. Galloway, "The Effects of Ionizing Radiation on the Breakdown Voltage of Power MOSFETs," IEEE Trans. Nucl. Sci. 30 (1983) 4116-4121.
    • (1983) IEEE Trans. Nucl. Sci. , vol.30 , pp. 4116-4121
    • Blackburn, D.L.1    Benedetto, J.M.2    Galloway, K.F.3
  • 29
    • 0022898901 scopus 로고
    • Characteristics of the breakdown voltage of power MOSFETS after total dose irradiation
    • R. D. Pugh, A. H. Johnson, and K. F. Galloway, "Characteristics of the Breakdown Voltage of Power MOSFETs After Total Dose Irradiation," IEEE Trans. Nucl. Sci. 33 (1986) 1460-1464.
    • (1986) IEEE Trans. Nucl. Sci. , vol.33 , pp. 1460-1464
    • Pugh, R.D.1    Johnson, A.H.2    Galloway, K.F.3
  • 31
    • 0025592878 scopus 로고
    • The effects of ionizing radiation on the breakdown voltage of p-channel power MOSFETs
    • S.L. Kosier, R.D. Schrimpf, F.E. Cellier, and K.F. Galloway, "The Effects of Ionizing Radiation on the Breakdown Voltage of P-Channel Power MOSFETs," IEEE Trans. Nucl. Sci. 37 (1990) 2076-2082.
    • (1990) IEEE Trans. Nucl. Sci. , vol.37 , pp. 2076-2082
    • Kosier, S.L.1    Schrimpf, R.D.2    Cellier, F.E.3    Galloway, K.F.4
  • 33
    • 0000765733 scopus 로고
    • Practical approach to ion track energy distribution
    • W.J. Stapor and P.T. McDonald, "Practical Approach to Ion Track Energy Distribution," J. Appl. Phys 64 (1988) 4430-4434.
    • (1988) J. Appl. Phys , vol.64 , pp. 4430-4434
    • Stapor, W.J.1    McDonald, P.T.2
  • 36
    • 0023560044 scopus 로고
    • Heavy-ion induced gate rupture in power MOSFETs
    • T.A. Fischer, "Heavy-Ion Induced Gate Rupture in Power MOSFETs," IEEE Trans. Nucl. Sci. 34 (1987) 1786-1791.
    • (1987) IEEE Trans. Nucl. Sci. , vol.34 , pp. 1786-1791
    • Fischer, T.A.1
  • 39
    • 0030127778 scopus 로고    scopus 로고
    • Experimental studies of single-event gate rupture and burnout in vertical power MOSFETs
    • J. L. Titus and C. F. Wheatley, "Experimental Studies of Single-Event Gate Rupture and Burnout in Vertical Power MOSFETs," IEEE Trans. Nucl. Sci. 43 (1996) 533-545.
    • (1996) IEEE Trans. Nucl. Sci. , vol.43 , pp. 533-545
    • Titus, J.L.1    Wheatley, C.F.2
  • 40
    • 0030350167 scopus 로고    scopus 로고
    • First observation of proton induced power MOSFET burnout in space: The CRUX experiment on APEX
    • J.W. Adolphsen, J.L. Barth, and G.B. Gee, "First Observation of Proton Induced Power MOSFET Burnout in Space: The CRUX Experiment on APEX, " IEEE Trans. Nucl. Sci. 43 (1996) 2921-2926.
    • (1996) IEEE Trans. Nucl. Sci. , vol.43 , pp. 2921-2926
    • Adolphsen, J.W.1    Barth, J.L.2    Gee, G.B.3
  • 42
    • 84939713843 scopus 로고    scopus 로고
    • Solutions to heavy ion induced avalanche burnout in power devices
    • T.F. Wrobel and D.E. Beutler, "Solutions to Heavy Ion Induced Avalanche Burnout in Power Devices," IEEE Trans. Nucl. Sci. 39 (1996) 1636-1641.
    • (1996) IEEE Trans. Nucl. Sci. , vol.39 , pp. 1636-1641
    • Wrobel, T.F.1    Beutler, D.E.2
  • 45
  • 46
    • 0023562592 scopus 로고
    • On heavy ion induced hard-errors in dielectric structures
    • T.F. Wrobel, "On Heavy Ion Induced Hard-Errors in Dielectric Structures," IEEE Trans. Nucl. Sci. 34 (1987) 1262-1268.
    • (1987) IEEE Trans. Nucl. Sci. , vol.34 , pp. 1262-1268
    • Wrobel, T.F.1
  • 48
    • 0028693951 scopus 로고
    • Single-event gate rupture in vertical power MOSFETs: An original empirical expression
    • C. F. Wheatley, J. L. Titus, and D. I. Burton, "Single-Event Gate Rupture in Vertical Power MOSFETs: An Original Empirical Expression," IEEE Trans. Nucl. Sci. 41 (1994) 2152-2159.
    • (1994) IEEE Trans. Nucl. Sci. , vol.41 , pp. 2152-2159
    • Wheatley, C.F.1    Titus, J.L.2    Burton, D.I.3
  • 50
    • 0345750992 scopus 로고
    • Single-event gate rupture commercial power MOSFETs
    • D.K. Nichols, J.R. Cross, and K.P. McCarty, "Single-Event Gate Rupture Commercial Power MOSFETs," Conf. Record, RADECS 93 (1993) 462-467.
    • (1993) Conf. Record, RADECS , vol.93 , pp. 462-467
    • Nichols, D.K.1    Cross, J.R.2    McCarty, K.P.3


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.