-
1
-
-
67650948319
-
-
10.1146/annurev-matsci-082908-145336
-
E. A. Costner, M. W. Lin, W.-L. Jen, and C. G. Willson, Annu. Rev. Mater. Res. 39, 155 (2009). 10.1146/annurev-matsci-082908-145336
-
(2009)
Annu. Rev. Mater. Res.
, vol.39
, pp. 155
-
-
Costner, E.A.1
Lin, M.W.2
Jen, W.-L.3
Willson, C.G.4
-
2
-
-
0034314803
-
Charge induced pattern distortion in low energy electron beam lithography
-
DOI 10.1116/1.1321755
-
K. M. Satyalakshmi, A. Olkhovets, M. G. Metzler, C. K. Harnett, D. M. Tanenbaum, and H. G. Craighead, J. Vac. Sci. Technol. B 18, 3122 (2000). 10.1116/1.1321755 (Pubitemid 32088169)
-
(2000)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.18
, Issue.6
, pp. 3122-3125
-
-
Satyalakshmi, K.M.1
Olkhovets, A.2
Metzler, M.G.3
Harnett, C.K.4
Tanenbaum, D.M.5
Craighead, H.G.6
-
4
-
-
0038020953
-
-
10.1016/S0167-9317(03)00075-3
-
S. Johnson, D. J. Resnick, D. Mancini, K. Nordquist, W. J. Dauksher, K. Gehoski, J. H. Baker, L. Dues, A. Hooper, T. C. Bailey, S. V. Sreenivasan, J. G. Ekerdt, and C. G. Willson, Microelectron. Eng. 67-68, 221 (2003). 10.1016/S0167-9317(03)00075-3
-
(2003)
Microelectron. Eng.
, vol.67-68
, pp. 221
-
-
Johnson, S.1
Resnick, D.J.2
Mancini, D.3
Nordquist, K.4
Dauksher, W.J.5
Gehoski, K.6
Baker, J.H.7
Dues, L.8
Hooper, A.9
Bailey, T.C.10
Sreenivasan, S.V.11
Ekerdt, J.G.12
Willson, C.G.13
-
5
-
-
70449776163
-
-
10.1088/0957-4484/20/49/495303
-
K. Lim, J.-S. Wi, S.-W. Nam, S.-Y. Park, J.-J. Lee, and K.-B. Kim, Nanotechnology 20, 495303 (2009). 10.1088/0957-4484/20/49/495303
-
(2009)
Nanotechnology
, vol.20
, pp. 495303
-
-
Lim, K.1
Wi, J.-S.2
Nam, S.-W.3
Park, S.-Y.4
Lee, J.-J.5
Kim, K.-B.6
-
6
-
-
4243591197
-
Template fabrication schemes for step and flash imprint lithography
-
DOI 10.1016/S0167-9317(02)00462-8, PII S0167931702004628
-
T. C. Bailey, D. J. Resnick, D. Mancini, K. J. Nordquist, W. J. Dauksher, E. Ainley, A. Talin, K. Gehoski, J. H. Baker, B. J. Choi, S. Johnson, M. Colburn, M. Meissl, S. V. Sreenivasan, J. G. Ekerdt, and C. G. Willson, Microelectron. Eng. 61-62, 461 (2002). 10.1016/S0167-9317(02)00462-8 (Pubitemid 34613402)
-
(2002)
Microelectronic Engineering
, vol.61-62
, pp. 461-467
-
-
Bailey, T.C.1
Resnick, D.J.2
Mancini, D.3
Nordquist, K.J.4
Dauksher, W.J.5
Ainley, E.6
Talin, A.7
Gehoski, K.8
Baker, J.H.9
Choi, B.J.10
Johnson, S.11
Colburn, M.12
Meissl, M.13
Sreenivasan, S.V.14
Ekerdt, J.G.15
Willson, C.G.16
-
8
-
-
0036643928
-
Comparison of MIBK/IPA and water/IPA as PMMA developers for electron beam nanolithography
-
DOI 10.1016/S0167-9317(02)00468-9, PII S0167931702004689
-
S. Yasin, D. G. Hasko, and H. Ahmed, Microelectron. Eng. 61-62, 745 (2002). 10.1016/S0167-9317(02)00468-9 (Pubitemid 34613444)
-
(2002)
Microelectronic Engineering
, vol.61-62
, pp. 745-753
-
-
Yasin, S.1
Hasko, D.G.2
Ahmed, H.3
-
9
-
-
76949106650
-
-
10.1016/j.mee.2009.11.047
-
M. A. Mohammad, T. Fito, J. Chen, S. Buswell, M. Aktary, M. Stepanova, and S. K. Dew, Microelectron. Eng. 87, 1104 (2010). 10.1016/j.mee.2009.11.047
-
(2010)
Microelectron. Eng.
, vol.87
, pp. 1104
-
-
Mohammad, M.A.1
Fito, T.2
Chen, J.3
Buswell, S.4
Aktary, M.5
Stepanova, M.6
Dew, S.K.7
-
11
-
-
0035519213
-
Performance of the Raith 150 electron-beam lithography system
-
DOI 10.1116/1.1414018, 45th International COnference on Electron, Ion, and Photon Beam Technology and Nanofabrication
-
J. G. Goodberlet, J. T. Hastings, and H. I. Smith, J. Vac. Sci. Technol. B 19, 2499 (2001). 10.1116/1.1414018 (Pubitemid 34089772)
-
(2001)
Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures
, vol.19
, Issue.6
, pp. 2499-2503
-
-
Goodberlet, J.G.1
Hastings, J.T.2
Smith, H.I.3
-
12
-
-
23744461889
-
Silver nanowires
-
DOI 10.1140/epjd/e2005-00108-7
-
A. Graff, D. Wagner, H. Ditlbacher, and U. Kreibig, Eur. Phys. J. D 34, 263 (2005). 10.1140/epjd/e2005-00108-7 (Pubitemid 41125745)
-
(2005)
European Physical Journal D
, vol.34
, Issue.1-3
, pp. 263-269
-
-
Graff, A.1
Wagner, D.2
Ditlbacher, H.3
Kreibig, U.4
-
13
-
-
0026122021
-
Nanostructure fabrication by electron beam lithography on insulating substrates using a novel four-layer resist
-
DOI 10.1016/0167-9317(91)90083-P, Microcircuit Engineering '90
-
W. Langheinrich and H. Beneking, Microelectron. Eng. 13, 225 (1991). 10.1016/0167-9317(91)90083-P (Pubitemid 21665469)
-
(1991)
Microelectronic Engineering
, vol.13
, Issue.1-4
, pp. 225-228
-
-
Langheinrich Wolfram1
Beneking Heinz2
|