-
1
-
-
0034316495
-
-
Bailey T., Choi B.J., Colburn M., Meissl M., Shaya S., Ekerdt J.G., Sreenivasan S.V., Willson C.G. J. Vac. Sci. Technol. B. 18:(6):2000;3572.
-
(2000)
J. Vac. Sci. Technol. B
, vol.18
, Issue.6
, pp. 3572
-
-
Bailey, T.1
Choi, B.J.2
Colburn, M.3
Meissl, M.4
Shaya, S.5
Ekerdt, J.G.6
Sreenivasan, S.V.7
Willson, C.G.8
-
2
-
-
0009367067
-
-
Colburn M., Johnson S., Stewart M., Damle S., Bailey T., Choi B., Wedlake M., Michaelson T., Sreenivasan S.V., Ekerdt J., Willson C.G. Proc. SPIE Emerg. Lithogr. Technol. III:1999;379.
-
(1999)
Proc. SPIE Emerg. Lithogr. Technol.
, vol.3
, pp. 379
-
-
Colburn, M.1
Johnson, S.2
Stewart, M.3
Damle, S.4
Bailey, T.5
Choi, B.6
Wedlake, M.7
Michaelson, T.8
Sreenivasan, S.V.9
Ekerdt, J.10
Willson, C.G.11
-
3
-
-
0035397511
-
-
Colburn M., Bailey T., Choi B.J., Ekerdt J.G., Sreenivasan S.V. Solid State Technol. June:2001;67.
-
(2001)
Solid State Technol.
, vol.JUNE
, pp. 67
-
-
Colburn, M.1
Bailey, T.2
Choi, B.J.3
Ekerdt, J.G.4
Sreenivasan, S.V.5
-
4
-
-
0000996008
-
-
Resnick D.J., Dauksher W.J., Mancini D., Nordquist K.J., Ainley E., Gehoski K., Baker J.H., Bailey T.C., Choi B.J., Johnson S., Sreenivasan S.V., Ekerdt J.G., Willson C.G. Proc. SPIE. 4688:2002;205.
-
(2002)
Proc. SPIE
, vol.4688
, pp. 205
-
-
Resnick, D.J.1
Dauksher, W.J.2
Mancini, D.3
Nordquist, K.J.4
Ainley, E.5
Gehoski, K.6
Baker, J.H.7
Bailey, T.C.8
Choi, B.J.9
Johnson, S.10
Sreenivasan, S.V.11
Ekerdt, J.G.12
Willson, C.G.13
-
5
-
-
0036883179
-
-
Dauksher W.J., Nordquist K.J., Mancini D.P., Resnick D.J., Baker J.H., Hooper A.E., Talin A. J. Vac. Sci. Technol. B. 20:(6):2002;2857-2861.
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, Issue.6
, pp. 2857-2861
-
-
Dauksher, W.J.1
Nordquist, K.J.2
Mancini, D.P.3
Resnick, D.J.4
Baker, J.H.5
Hooper, A.E.6
Talin, A.7
-
6
-
-
0036883178
-
-
Mancini D.P., Gehoski K.A., Ainley E., Nordquist K.J., Resnick D.J., Bailey T.C., Sreenivasan S.V., Ekerdt J.G., Willson C.G. J. Vac. Sci. Technol. B. 20:(6):2002;2896-2901.
-
(2002)
J. Vac. Sci. Technol. B
, vol.20
, Issue.6
, pp. 2896-2901
-
-
Mancini, D.P.1
Gehoski, K.A.2
Ainley, E.3
Nordquist, K.J.4
Resnick, D.J.5
Bailey, T.C.6
Sreenivasan, S.V.7
Ekerdt, J.G.8
Willson, C.G.9
-
7
-
-
0035519444
-
-
Macintyre D.S., Chen Y., Lim D., Thoms S. J. Vac. Sci. Technol. B. 19:(6):2001;2797.
-
(2001)
J. Vac. Sci. Technol. B
, vol.19
, Issue.6
, pp. 2797
-
-
Macintyre, D.S.1
Chen, Y.2
Lim, D.3
Thoms, S.4
-
8
-
-
0033132678
-
-
Ainley E., Nordquist K., Resnick D.J., Carr D.W., Tiberio R.C. Microelectron. Eng. 46:1999;375-378.
-
(1999)
Microelectron. Eng.
, vol.46
, pp. 375-378
-
-
Ainley, E.1
Nordquist, K.2
Resnick, D.J.3
Carr, D.W.4
Tiberio, R.C.5
-
9
-
-
4243591197
-
-
Bailey T.C., Resnick D.J., Mancini D., Nordquist K.J., Dauksher W.J., Ainley E., Talin A., Gehoski K., Baker J.H., Choi B.J., Johnson S., Colburn M., Meissl M., Sreenivasan S.V., Ekerdt J.G., Willson C.G. Microelectron. Eng. 61-62:2002;461-467.
-
(2002)
Microelectron. Eng.
, vol.61-62
, pp. 461-467
-
-
Bailey, T.C.1
Resnick, D.J.2
Mancini, D.3
Nordquist, K.J.4
Dauksher, W.J.5
Ainley, E.6
Talin, A.7
Gehoski, K.8
Baker, J.H.9
Choi, B.J.10
Johnson, S.11
Colburn, M.12
Meissl, M.13
Sreenivasan, S.V.14
Ekerdt, J.G.15
Willson, C.G.16
-
10
-
-
0035399945
-
-
Choi B.J., Johnson S., Colburn M., Sreenivasan S.V., Willson C.G. Precision Eng. 25:(3):2001;192.
-
(2001)
Precision Eng.
, vol.25
, Issue.3
, pp. 192
-
-
Choi, B.J.1
Johnson, S.2
Colburn, M.3
Sreenivasan, S.V.4
Willson, C.G.5
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