-
1
-
-
37249061772
-
High-k/Ge MOSFETs for future nanoelectronics
-
DOI 10.1016/S1369-7021(07)70350-4, PII S1369702107703504
-
Y. Kamata, Mater Today., 11, 12 (2008). 10.1016/S1369-7021(07)70350-4 (Pubitemid 350266412)
-
(2008)
Materials Today
, vol.11
, Issue.1-2
, pp. 30-38
-
-
Kamata, Y.1
-
2
-
-
33846464162
-
Influence of Ge substrate crystallinity on Co germanide formation in solid-state reactions
-
DOI 10.1063/1.2431781
-
K. Opsomer, D. Deduytsche, C. Detavernier, R. L. Van Meirhaeghe, A. Lauwers, K. Maex, and C. Lavoie, Appl. Phys. Lett., 90, 031906 (2007). 10.1063/1.2431781 (Pubitemid 46146341)
-
(2007)
Applied Physics Letters
, vol.90
, Issue.3
, pp. 031906
-
-
Opsomer, K.1
Deduytsche, D.2
Detavernier, C.3
Van Meirhaeghe, R.L.4
Lauwers, A.5
Maex, K.6
Lavoie, C.7
-
3
-
-
48949103604
-
-
10.1063/1.2956708
-
E. Simoen, K. Opsomer, C. Claeys, K. Maex, C. Detavernier, R. L. Van Meirhaeghe, and P. Clauws, J. Appl. Phys., 104, 023705 (2008). 10.1063/1.2956708
-
(2008)
J. Appl. Phys.
, vol.104
, pp. 023705
-
-
Simoen, E.1
Opsomer, K.2
Claeys, C.3
Maex, K.4
Detavernier, C.5
Van Meirhaeghe, R.L.6
Clauws, P.7
-
4
-
-
33845962528
-
Fermi-level pinning and charge neutrality level in germanium
-
DOI 10.1063/1.2410241
-
A. Dimoulas, P. Tsipas, A. Sotiropoulos, and E. K. Evangelou, Appl. Phys. Lett., 89, 252110 (2006). 10.1063/1.2410241 (Pubitemid 46035146)
-
(2006)
Applied Physics Letters
, vol.89
, Issue.25
, pp. 252110
-
-
Dimoulas, A.1
Tsipas, P.2
Sotiropoulos, A.3
Evangelou, E.K.4
-
5
-
-
34648814123
-
Evidence for strong Fermi-level pinning due to metal-induced gap states at metal/germanium interface
-
DOI 10.1063/1.2789701
-
T. Nishimura, K. Kita, and A. Toriumi, Appl. Phys. Lett., 91, 123123 (2007). 10.1063/1.2789701 (Pubitemid 47461955)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.12
, pp. 123123
-
-
Nishimura, T.1
Kita, K.2
Toriumi, A.3
-
6
-
-
33645521777
-
-
10.1063/1.2159096
-
D. Connelly, C. Faulkner, P. A. Clifton, and D. E. Grupp, Appl. Phys. Lett., 88, 012105 (2006). 10.1063/1.2159096
-
(2006)
Appl. Phys. Lett.
, vol.88
, pp. 012105
-
-
Connelly, D.1
Faulkner, C.2
Clifton, P.A.3
Grupp, D.E.4
-
7
-
-
59349099753
-
-
10.1063/1.3065990
-
M. Kobayashi, A. Kinoshita, K. Saraswat, H.-S. P. Wong, and Y. Nishi, J. Appl. Phys., 105, 023702 (2009). 10.1063/1.3065990
-
(2009)
J. Appl. Phys.
, vol.105
, pp. 023702
-
-
Kobayashi, M.1
Kinoshita, A.2
Saraswat, K.3
Wong, H.-S.P.4
Nishi, Y.5
-
8
-
-
38349119448
-
-
10.1063/1.2831918
-
R. R. Lieten, S. Degroote, M. Kuijk, and G. Borghs, Appl. Phys. Lett., 92, 022106 (2008). 10.1063/1.2831918
-
(2008)
Appl. Phys. Lett.
, vol.92
, pp. 022106
-
-
Lieten, R.R.1
Degroote, S.2
Kuijk, M.3
Borghs, G.4
-
9
-
-
57049138332
-
-
10.1143/APEX.1.051406
-
T. Nishimura, K. Kita, and A. Toriumi, Appl. Phys. Express, 1, 051406 (2008). 10.1143/APEX.1.051406
-
(2008)
Appl. Phys. Express
, vol.1
, pp. 051406
-
-
Nishimura, T.1
Kita, K.2
Toriumi, A.3
-
10
-
-
56849119293
-
-
10.1063/1.3028343
-
Y. Zhou, M. Ogawa, X. Han, and K. L. Wang, Appl. Phys. Lett., 93, 202105 (2008). 10.1063/1.3028343
-
(2008)
Appl. Phys. Lett.
, vol.93
, pp. 202105
-
-
Zhou, Y.1
Ogawa, M.2
Han, X.3
Wang, K.L.4
-
11
-
-
79952407230
-
-
10.1063/1.3562305
-
J.-Y. Lin, A. M. Roy, A. Nainani, Y. Sun, and K. C. Saraswat, Appl. Phys. Lett., 98, 092113 (2011) 10.1063/1.3562305
-
(2011)
Appl. Phys. Lett.
, vol.98
, pp. 092113
-
-
Lin, J.-Y.1
Roy, A.M.2
Nainani, A.3
Sun, Y.4
Saraswat, K.C.5
-
12
-
-
77956812194
-
-
10.1063/1.3490710
-
Q. Xie, D. Deduytsche, M. Schaekers, M. Caymax, A. Delabie, X. P. Qu, and C. Detavernier, Appl. Phys. Lett., 97, 112905 (2010). 10.1063/1.3490710
-
(2010)
Appl. Phys. Lett.
, vol.97
, pp. 112905
-
-
Xie, Q.1
Deduytsche, D.2
Schaekers, M.3
Caymax, M.4
Delabie, A.5
Qu, X.P.6
Detavernier, C.7
-
13
-
-
77957552123
-
-
10.1109/LED.2010.2058838
-
A. M. Roy, J.-Y. J. Lin, and K. C. Saraswat, IEEE Electron Device Lett., 31, 1077 (2010). 10.1109/LED.2010.2058838
-
(2010)
IEEE Electron Device Lett.
, vol.31
, pp. 1077
-
-
Roy, A.M.1
Lin, J.-Y.J.2
Saraswat, K.C.3
-
14
-
-
34548230096
-
Effective electrical passivation of Ge(100) for high- k gate dielectric layers using germanium oxide
-
DOI 10.1063/1.2773759
-
A. Delabie, F. Bellenger, M. Houssa, T. Conard, S. V. Elshocht, M. Caymax, M. Heyns, and M. Meuris, Appl. Phys. Lett., 91, 082904 (2007) 10.1063/1.2773759 (Pubitemid 47318977)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.8
, pp. 082904
-
-
Delabie, A.1
Bellenger, F.2
Houssa, M.3
Conard, T.4
Van Elshocht, S.5
Caymax, M.6
Heyns, M.7
Meuris, M.8
-
15
-
-
78650650758
-
-
10.1063/1.3524208
-
Q. Xie, J. Musschoot, M. Schaekers, M. Caymax, A. Delabie, X. P. Qu, Y. L. Jiang, S. V. den Berghe, J. H. Liu, and C. Detavernier, Appl. Phys. Lett., 97, 222902 (2010). 10.1063/1.3524208
-
(2010)
Appl. Phys. Lett.
, vol.97
, pp. 222902
-
-
Xie, Q.1
Musschoot, J.2
Schaekers, M.3
Caymax, M.4
Delabie, A.5
Qu, X.P.6
Jiang, Y.L.7
Den Berghe, S.V.8
Liu, J.H.9
Detavernier, C.10
-
16
-
-
79952502370
-
-
10.1149/1.3559770
-
Q. Xie, J. Musschoot, M. Schaekers, M. Caymax, A. Delabie, D. Lin, X. P. Qu, Y. L. Jiang, S. V. den Berghe, J. H. Liu, and C. Detavernier, Electrochem. Solid-State Lett., 14, G27 (2011) 10.1149/1.3559770
-
(2011)
Electrochem. Solid-State Lett.
, vol.14
, pp. 27
-
-
Xie, Q.1
Musschoot, J.2
Schaekers, M.3
Caymax, M.4
Delabie, A.5
Lin, D.6
Qu, X.P.7
Jiang, Y.L.8
Den Berghe, S.V.9
Liu, J.H.10
Detavernier, C.11
-
20
-
-
77951542974
-
-
10.1063/1.3387760
-
A. V. Thathachary, K. N. Bhat, N. Bhat, and M. S. Hegde, Appl. Phys. Lett., 96, 152108 (2010). 10.1063/1.3387760
-
(2010)
Appl. Phys. Lett.
, vol.96
, pp. 152108
-
-
Thathachary, A.V.1
Bhat, K.N.2
Bhat, N.3
Hegde, M.S.4
-
21
-
-
34648814123
-
Evidence for strong Fermi-level pinning due to metal-induced gap states at metal/germanium interface
-
DOI 10.1063/1.2789701
-
T. Nishimura, K. Kita, and A. Toriumi, Appl. Phys. Lett., 91, 123123 (2007). 10.1063/1.2789701 (Pubitemid 47461955)
-
(2007)
Applied Physics Letters
, vol.91
, Issue.12
, pp. 123123
-
-
Nishimura, T.1
Kita, K.2
Toriumi, A.3
-
22
-
-
33947303049
-
Schottky contact barrier height extraction by admittance measurement
-
DOI 10.1063/1.2472276
-
Y. L. Jiang, J. Luo, Y. Yao, F. Lu, G. P. Ru, X. P. Qu, and B. Z. Li, J. Appl. Phys., 101, 053705 (2007). 10.1063/1.2472276 (Pubitemid 46439967)
-
(2007)
Journal of Applied Physics
, vol.101
, Issue.5
, pp. 053705
-
-
Jiang, Y.-L.1
Luo, J.2
Yao, Y.3
Lu, F.4
Ru, G.-P.5
Qu, X.-P.6
Li, B.-Z.7
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