System implications of memory reliability in exascale computing

Proceedings of 2011 SC - International Conference for High Performance Computing, Networking, Storage and Analysis

Volumn , Issue , 2011, Pages

  Li, Sheng ^a   Chen, Ke ^a,b   Hsieh, Ming Yu ^c   Muralimanohar, Naveen ^a   Kersey, Chad D ^d   Brockman, Jay B ^b   Rodrigues, Arun F ^c   Jouppi, Norman P ^a  

^a HEWLETT PACKARD LABORATORIES   (United States)

^b UNIVERSITY OF NOTRE DAME   (United States)

^c SANDIA NATIONAL LABORATORIES   (United States)

^d GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

Author keywords

BCH; Checkpointing; Chipkill; DRAM; ECC; Exascale computing; Memory system; Reliability; Tagged memory

Indexed keywords

BCH; CHECK POINTING; CHIPKILL; ECC; EXASCALE COMPUTING; MEMORY SYSTEMS; TAGGED MEMORY;

COMPUTER SOFTWARE SELECTION AND EVALUATION; FAULT TOLERANCE; RELIABILITY; RELIABILITY ANALYSIS;

DYNAMIC RANDOM ACCESS STORAGE;

EID: 83155182888     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1145/2063384.2063445     Document Type: Conference Paper

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