Pattern-free growth of carbon nanotube tips for scanning probe microscopy

Nanoscience and Nanotechnology Letters

Volumn 3, Issue 5, 2011, Pages 669-673

  Yenilmez, Erhan ^a   Zhang, Hanshen ^a   Zhang, Li ^a   Deng, Zhifeng ^a   Moler, Kathryn A ^a  

^a STANFORD UNIVERSITY   (United States)

Author keywords

Atomic Force Microscopy; Carbon Nanotubes; Chemical Vapor Deposition; Nanotube Tip; Scanning Probe Microscopy

Indexed keywords

CARBON NANOTUBE TIP; CATALYST PREPARATION; CHEMICAL VAPOR; CHEMICAL VAPOR DEPOSITION METHODS; CNT TIP; COBALT NANOPARTICLES; GROWTH YIELD; KEY VARIABLES; MASS PRODUCTION; SCALE-UP; SCANNING PROBES; SILICON CANTILEVER; SILICON PROBE; WAFER SURFACE;

ATOMIC FORCE MICROSCOPY; CARBON; CARBON NANOTUBES; CATALYSTS; COBALT; ETHANOL; NANOCANTILEVERS; SILICON OXIDES; SILICON WAFERS;

CHEMICAL VAPOR DEPOSITION;

EID: 82455206146     PISSN: 19414900     EISSN: 19414919     Source Type: Journal    
DOI: 10.1166/nnl.2011.1239     Document Type: Article

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