Nanotube manipulation with focused ion beam

Applied Physics Letters

Volumn 88, Issue 2, 2006, Pages 1-3

  Deng, Zhifeng ^a   Yenilmez, Erhan ^a   Reilein, Amy ^b   Leu, Joshua ^b   Dai, Hongjie ^a   Moler, Kathryn A ^a  

^a STANFORD UNIVERSITY   (United States)

^b STANFORD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

HIGH-ASPECT-RATIO STRUCTURES; METAL-COATED CARBON NANOTUBES; SCANNING PROBE MICROSCOPY;

ANGLE MEASUREMENT; CELLS; ION BEAMS; MICROMETERS; MICROSCOPIC EXAMINATION;

CARBON NANOTUBES;

EID: 30744458315     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2161395     Document Type: Article

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