Sum frequency generation-compressive sensing microscope

Journal of Chemical Physics

Volumn 135, Issue 19, 2011, Pages

  Cai, Xiaojun ^a   Hu, Bian ^a   Sun, Ting ^b   Kelly, Kevin F ^b   Baldelli, Steven ^a  

^a University of Houston   (United States)

^b Rice University   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

DETECTION LIMITS; HIGH QUALITY IMAGES; PHOTO MULTIPLIER TUBE; PSEUDO RANDOM PATTERN; RASTER SCANS; SAMPLING METHOD; SAMPLING THEORY; SI SURFACES; SUM FREQUENCY; SUM FREQUENCY GENERATION; SURFACE STUDY; TESTING PATTERN;

IMAGE QUALITY; LIGHT MODULATORS; PHOTOMULTIPLIERS; SURFACE TESTING;

SIGNAL RECONSTRUCTION;

EID: 81855228596     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3660202     Document Type: Article

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