Chemical imaging of interfaces by sum-frequency generation microscopy: Application to patterned self-assembled monolayers

Applied Physics Letters

Volumn 83, Issue 18, 2003, Pages 3830-3832

  Kuhnke, K ^a   Hoffmann, D M P ^a   Wu, X C ^a   Bittner, A M ^a   Kern, K ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CHEMICAL ANALYSIS; COMPOSITION; CURRENT DENSITY; ELECTRIC CONTACTS; GOLD; MICROSCOPIC EXAMINATION; MOLECULAR VIBRATIONS; MOLECULES; MONOLAYERS; POLYCRYSTALLINE MATERIALS; SELF ASSEMBLY;

ALKANETHIOLATE STRIPES; CARBOXYALKANETHIOLATE; CHEMICAL IMAGING; ELECTRONIC AND VIBRATIONAL CONTRAST; SELF ASSEMBLY MONOLAYERS; SUM FREQUENCY GENERATION MICROSCOPY;

PLASTIC FILMS;

EID: 0344928468     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1624465     Document Type: Article

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