Chemical microscopy of surfaces by sum frequency generation imaging

Journal of Physical Chemistry C

Volumn 113, Issue 38, 2009, Pages 16575-16588

  Cimatu, Katherine A ^a   Baldelli, Steven ^b  

^a TEXAS A AND M UNIVERSITY   (United States)

^b ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

Author keywords

[No Author keywords available]

Indexed keywords

ACCUMULATION TIME; ADSORBED MOLECULES; CHEMICAL MICROSCOPY; CHEMICAL SENSITIVITY; CORROSIVE MATERIALS; CURRENT RESOLUTION; CYANIDE SOLUTION; DIFFRACTION LIMITED; IMAGING MICROSCOPY; MAPPING ANALYSIS; METAL SURFACES; REGION OF INTEREST; SPATIAL RESOLUTION; SUM FREQUENCY GENERATION; TWO-DIMENSIONAL IMAGES;

CHEMICAL PROPERTIES; CYANIDES; MONOLAYERS; SIGNAL TO NOISE RATIO; SURFACE REACTIONS; SURFACES;

TWO DIMENSIONAL;

EID: 70349871208     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp904015s     Document Type: Article

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