Chemical imaging of interfaces by sum frequency microscopy

Langmuir

Volumn 15, Issue 17, 1999, Pages 5437-5439

  Flörsheimer, Mathias ^a   Brillert, Christof ^a   Fuchs, Harald ^a  

^a UNIVERSITY OF MÜNSTER   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

IMAGE PROCESSING; LASER PULSES; MONOLAYERS; NONLINEAR OPTICS; OPTICAL MICROSCOPY; OPTICAL RESOLVING POWER; PHASE INTERFACES; PULSED LASER APPLICATIONS;

CHEMICAL IMAGING; SUM FREQUENCY MICROSCOPY;

LANGMUIR BLODGETT FILMS;

EID: 0344671629     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la9815603     Document Type: Article

References (27)

1. Adamson, A. A. Physical Chemistry of Surfaces; John Wiley: New York, 1990.
2. Reimer, L. Scanning Electron Microscopy; Springer: Berlin, 1985.
3. Smith, G. C. Surface Analysis by Electron Spectroscopy; Plenum Press: New York, 1994.
4. Benninghoven, A.; Hagenhoff, B.; Niehuis, E. Anal. Chem. 1993, 65, 630.
5. Wiesendanger, R. Scanning Probe Microscopy and Spectroscopy; Cambridge University Press: Cambridge, 1994.
6. Wiesendanger, R., Ed.; Scanning Probe Microscopy; Springer: Berlin, 1998.
7. Treado, P. J. Laser Focus World 1995, 31, 75.
8. (a) Dhamelincourt, P.; Barbillat, J.; Delhaye, M. Spectrosc. Eur. 1993, 5, 16.
9. (b) Evans, S. D.; Freeman, T. L.; Flynn, T. M.; Batchelder, D. N.; Ulman, A. Thin Solid Films 1994, 244, 778.
10. Boyd, R. W. Nonlinear Optics; Academic Press: San Diego, CA, 1992.
11. Shen, Y. R. Nature 1989, 337, 519.
12. Vogel, V.; Shen, Y. R. Annu. Rev. Mater. Sci. 1991, 21, 515.
13. Buck, M. Appl. Phys. A 1992, 55, 395.
14. Corn, R. M.; Higgings, D. A. Chem. Rev. 1994, 94, 107.
15. Bain, C. D. J. Chem. Soc., Faraday Trans. 1995, 91, 1281.
16. Eisenthal, K. B. Chem. Rev. 1996, 96, 1343.
17. MacPhail, R. A.; Strauss, H. L.; Snyder, R. G.; Elliger, C. A. J. Phys. Chem. 1984, 88, 334.
18. Guyot-Sionnest, P.; Hunt, J. H.; Shen, Y. R. Phys. Rev. Lett. 1987, 59, 1597.
19. The micrograph can be corrected for the inhomogeneous laser beam profiles by normalization with an image of a homogeneous surface such as a freshly prepared LB monolayer of arachidic acid.
20. 2 signals from such monolayers can be observed with the SF microscope. So far, we cannot quantify the number of gauche defects. A future calibration of the SF signals as a measure of kink densities could, however, be obtained by measuring the SF intensities from specimens whose density of gauche defects has been determined or estimated by other means such as molecular dynamics simulations or IR spectroscopy.
21. Bubeck, Ch. Adv. Mater. 1990, 2, 537.
22. Gleiche, M.; Chi, L. F.; Fuchs, H. Thin Solid Films 1998, 327-329, 268.
23. A small molecular coverage results in a high density of silver grains and a high reflected light intensity in the linear optical micrographs. The signal was observed to be almost as high as the reflected light intensity from the bare, clean substrate after silver decoration. A fluid lipid phase could be well distinguished from the bare substrate.
24. 24 for the determination of symmetry and order of interfaces. SH imaging does not allow chemical analyses, but we have demonstrated that these nonlinear microscopes can be operated with the objective axis normal to the interface.
25. (a) Florsheimer, M.; Bösch, M.; Brillert, Ch.; Wierschem, M.; Fuchs, H. Supramol. Sci. 1987, 4, 255.
26. (b) Flörsheimer, M.; Bosch, M.; Brillert, Ch.; Wierschem, M.; Fuchs, H. Adv. Mater. 1997, 9, 1061.
27. (c) Florsheimer, M.; Salmen, H.; Bösch, M.; Brillert, Ch.; Wierschem, M.; Fuchs, H. 1997, 9, 1061.