Sum-frequency generation microscope for opaque and reflecting samples

Review of Scientific Instruments

Volumn 73, Issue 9, 2002, Pages 3221-

  Hoffmann, D M P ^a   Kuhnke, K ^a   Kern, K ^a  

^a MAX PLANCK INSTITUT FÜR FESTKÖRPERFORSCHUNG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 18544374125     PISSN: 00346748     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1499757     Document Type: Article

References (0)