Adsorption and structure of octadecanethiol on zinc surfaces as probed by sum frequency generation spectroscopy, imaging, and electrochemical techniques

Journal of Physical Chemistry C

Volumn 111, Issue 47, 2007, Pages 17587-17596

  Hedberg, Jonas ^a   Leygraf, Christofer ^a   Cimatu, Katherine ^b   Baldelli, Steven ^b  

^a ROYAL INSTITUTE OF TECHNOLOGY   (Sweden)

^b University of Houston   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CORROSION PROTECTIVE ABILITY; OCTADECANETHIOL (ODT); SUM FREQUENCY GENERATION;

ADSORPTION; CORROSION PROTECTION; SURFACE PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY; ZINC;

MOLECULAR STRUCTURE;

EID: 37049013707     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp075286+     Document Type: Article

References (44)

1. Bain, C. D.; Troughton, E. B.; Tao, Y.-T.; Evall, J.; Whitesides, G. M.; Nuzzo, R. G. J. Am. Chem. Soc. 1989, 111, 321.
2. Yan, C.; Zharnikov, M.; Gölzhäuser, A.; Grunze, M. Langmuir 2000, 16, 6208.
3. Keller, H.; Simak, P.; Schrepp, W.; Dembowski, J. Thin Solid Films 1994, 244, 799.
4. Ron, H.; Cohen, H.; Matlis, S.; Rappaport, M.; Rubinstien, I. J. Phys. Chem. B 1998, 102, 9861.
5. Himmelhaus, M.; Gauss, I.; Buck, M.; Eisert, F.; Woll, C.; Grunze, J. M. Electron Spectros. Relat. Phenom. 1998, 92, 139.
6. Volmer-Uebing, M.; Stratmann, M.; Appl. Surf. Sci. 1992, 55, 19.
7. Zhang, H. P.; Romero, C.; Baldelli, S. J. Phys. Chem. B 2005, 109, 15520.
8. Zhang, H. P.; Baldelli, S. J. Phys. Chem. B 2006, 110, 24062.
9. Nogues, C.; Lang, P. Langmuir 2007, 23, 8385-8391.
10. Halevi, B; Vohs, J. M. Catal. Lett. 111 (No. 1, 2), 2006.
11. Dvorak, J.; Jirsak, T.; Rodriguez, J. A. Surf. Sci. 2001, 479, 155.
12. Halevi, B.; Vohs, J. M. J. Phys Chem. B 2005, 109, 23976.
13. Pesika, N. S.; Hu, Z.; Stebe, K. J.; Searson, P. C. J. Phys. Chem. B 2003, 106, 6985.
14. Wong, E. M.; Hoertz, P. G.; Liang, C. L.; Shi, B.-M.; Meyer, G. J.; Searson, P. C. Langmuir 2001, 17, 8362.
15. Cimatu, K.; Baldelli, S. J. Phys. Chem. B 2006, 110, 1807.
16. Bain, C. D. J. Chem. Soc., Faraday Trans. 1995, 91, 1281.
17. Shen, Y. R. Nature 1989, 337, 519.
18. Guyot-Sionnest, P.; Hunt, J. H.; Shen, Y. R. Phys. Rev. Lett. 1987, 59, 1597.
19. MacPhail, R. A.; Strauss, H. L.; Snyder, R. G.; Elliger, C. A. J. Phys. Chem. 1984, 88, 334.
20. Harris, A. L.; Chedney, C. E. D.; Levinos, N. J.; Loiacono, D. N. Chem. Phys. Lett. 1987, 141, 350.
21. Bain, C. D.; Davies, P. B.; Ong, T. H.; Ward, R. N. Langmuir 1991, 7, 1563.
22. Zhuang, X.; Miranda, P. B.; Kim, D.; Shen, Y. R. Phys. Rev. B 1999, 59, 12632.
23. Hirose, C.; Akamatsu, N.; Domen, K. Appl. Spectrosc. 1992, 6, 1051.
24. Wang, H. F.; Gan, W.; Lu, R.; Rao, Y.; Wu, B. H. Int. Rev. Phys. Chem. 2005, 24, 191.
25. Hirose, C.; Akamatsu, N.; Domen, K. J. Chem. Phys. 1992, 96, 997.
26. Hirose, C.; Yamamoto, H.; Akamatsu, N.; Domen, K. J. Phys Chem. 1993, 97, 10064.
27. Gray, D. E. American Institute of Physics Handbook; McGraw-Hill: New York, 1972.
28. Hodgson, J. N. Proc. Phys. Soc. 1955, 9B, 593.
29. Dean, J. A. Lange's Handbook of Chemistry; McGraw-Hill: New York, 1992.
30. Cimatu, K.; Baldelli, S. J. Phys. Chem. C 2007, 111, 7137.
31. Chaturvedi, S.; Rodriguez, J. A.; Hrbek, J. J. Phys. Chem. B 1997, 101, 10860.
32. Mekhalif, Z.; Massi, L.; Guittard, F.; Geribaldi, S.; Delhalle, J. Thin Solid Films 2002, 405, 186.
33. Wagner, C. D.; Riggs, W. M.; Davies, L. E.; Moulder, J. F.; Muilenberg, G. E. Handbook of X-ray Photoelectron Spectroscopy; Perkin-Elmer: Eden Prairie, MN, 1978.
34. Widrig, C. A.; Chung, C.; Porter, M. D. J. Electroanal. Chem. 1991, 310, 355.
35. Yang, D.-F.; Wilde, C.-P.; Morin, M. Langmuir 1997, 13, 243.
36. Yang, D.-F.; Wilde, C.-P.; Morin, M. Langmuir 1996, 12, 6570.
37. Hassan, H. H. Appl. Surf. Sci. 2001, 174, 201.
38. Macdonald, J. R.; Johnson, W. B. Fundamentals of Impedance Spectroscopy; John Wiley & Sons: New York, 2005.
39. Protsailo, L. V.; Fawcett, W. R. Electrochim. Acta 2002, 45, 3497.
40. Boubour, E.; Lennox, R. B. Langmuir 2000, 16, 4222.
41. Cimatu, K.; Baldelli, S. J. Am. Chem. Soc. 2006, 128, 16016.
42. Sinapi, F.; Forget, L.; Delhalle, J.; Mekhalif, Z. Appl. Surf. Sci. 2003, 212-213, 464-471.
43. Buck, M.; Eisert, F.; Fisher, J.; Grunze, M.; Träger, F. Appl. Phys. 1991, A53, 552.
44. Poirier, G. E.; Tarlov, M. J. J. Phys Chem. 1995, 99, 10966.