Second-harmonic and sum-frequency imaging of organic nanocrystals with photon scanning tunneling microscope

Applied Physics Letters

Volumn 77, Issue 19, 2000, Pages 2946-2948

  Shen, Yuzhen ^a   Swiatkiewicz, Jacek ^a   Winiarz, Jeff ^a   Markowicz, Przemyslaw ^a   Prasad, Paras N ^a  

^a UNIVERSITY AT BUFFALO   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 0000427344     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.1322629     Document Type: Article

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