Modeling of set and reset operations of phase-change memory cells

IEEE Electron Device Letters

Volumn 32, Issue 12, 2011, Pages 1737-1739

  Faraclas, Azer ^a   Williams, Nicholas ^a   Gokirmak, Ali ^a   Silva, Helena ^a  

^a UNIVERSITY OF CONNECTICUT   (United States)

Author keywords

Electric breakdown; Finite element methods; Phase change memory

Indexed keywords

CURRENT CONTINUITY; ELECTRICAL BREAKDOWN; FINITE ELEMENT; FINITE ELEMENT SIMULATIONS; HEAT EQUATION; LATENT HEAT OF FUSION; MEMORY CELL; MEMORY ELEMENT; ON CURRENTS; PHASE CHANGES; RESISTANCE STATE; ROTATIONAL SYMMETRIES; TEMPERATURE-DEPENDENT MATERIAL; VOLTAGE PULSE;

ANTIMONY; ELECTRIC BREAKDOWN; ELECTRIC POTENTIAL; FINITE ELEMENT METHOD; GERMANIUM; MELTING; PARTIAL DIFFERENTIAL EQUATIONS;

PHASE CHANGE MEMORY;

EID: 81855206591     PISSN: 07413106     EISSN: None     Source Type: Journal    
DOI: 10.1109/LED.2011.2168374     Document Type: Article

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