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Volumn 95, Issue 8, 2009, Pages

Threshold field of phase change memory materials measured using phase change bridge devices

Author keywords

[No Author keywords available]

Indexed keywords

AS-DEPOSITED STATE; ELECTRICAL FIELD; PARAMETERIZED; PHASE CHANGE; PHASE-CHANGE MEMORIES; THRESHOLD FIELDS; THRESHOLD SWITCHING; VARIABLE LENGTH;

EID: 69549126428     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3210792     Document Type: Article
Times cited : (139)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.