메뉴 건너뛰기




Volumn 51, Issue 11, 2004, Pages 1772-1782

Analytical modelling of single electron transistor for hybrid CMOS-SET analog IC design

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; COMPUTER AIDED DESIGN; COMPUTER SIMULATION; COULOMB BLOCKADE; ELECTRON TUNNELING; HYBRID INTEGRATED CIRCUITS; INTEGRATED CIRCUIT LAYOUT; MONTE CARLO METHODS; SEMICONDUCTOR DEVICE MODELS;

EID: 8144225171     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/TED.2004.837369     Document Type: Article
Times cited : (152)

References (26)
  • 2
    • 0033307465 scopus 로고    scopus 로고
    • Si complementary single-electron inverter
    • Y. Ono et al., "Si complementary single-electron inverter," in IEDM Tech. Dig., 1999, pp. 367-370.
    • (1999) IEDM Tech. Dig. , pp. 367-370
    • Ono, Y.1
  • 3
    • 0036228417 scopus 로고    scopus 로고
    • Programmable single-electron transistor logic for low-power intelligent Si LSI
    • K. Uchida, J. Koga, R. Ohba, and A. Toriumi, "Programmable single-electron transistor logic for low-power intelligent Si LSI," in Proc. ISSCC, vol. 2, 2002, pp. 162-453.
    • (2002) Proc. ISSCC , vol.2 , pp. 162-453
    • Uchida, K.1    Koga, J.2    Ohba, R.3    Toriumi, A.4
  • 5
    • 0036923558 scopus 로고    scopus 로고
    • Modeling and analysis of power dissipation in single electron logic
    • S. Mahapatra, A. M. Ionescu, K. Banerjee, and M. J. Declerq, " Modeling and analysis of power dissipation in single electron logic," in IEDM Tech. Dig., 2002, pp. 323-326.
    • (2002) IEDM Tech. Dig. , pp. 323-326
    • Mahapatra, S.1    Ionescu, A.M.2    Banerjee, K.3    Declerq, M.J.4
  • 6
    • 0035718150 scopus 로고    scopus 로고
    • A multiple-valued logic with merged single-electron and MOS transistors
    • H. Inokawa, A. Fujiwara, and Y. Takahashi, "A multiple-valued logic with merged single-electron and MOS transistors," in IEDM Tech. Dig., 2001, pp. 147-150.
    • (2001) IEDM Tech. Dig. , pp. 147-150
    • Inokawa, H.1    Fujiwara, A.2    Takahashi, Y.3
  • 7
    • 17644439135 scopus 로고    scopus 로고
    • SETMOS: A novel true hybrid SET- CMOS high current Coulomb blockade oscillation cell for future nano-scale analog ICs
    • S. Mahapatra et al., "SETMOS: A novel true hybrid SET- CMOS high current Coulomb blockade oscillation cell for future nano-scale analog ICs," in IEDM Tech. Dig., 2003, pp. 703-706.
    • (2003) IEDM Tech. Dig. , pp. 703-706
    • Mahapatra, S.1
  • 9
    • 0006825518 scopus 로고    scopus 로고
    • Coulomb blockade memory using integrated single-electron transistor /metal-oxide semiconductor transistor grain cells
    • Dec
    • Z. A. K. Durrani, A. C. Irvine, and H. Ahmed, "Coulomb blockade memory using integrated single-electron transistor/metal-oxide semiconductor transistor grain cells," IEEE Trans. Electron Devices, vol. 47, pp. 2334-2339, Dec. 2000.
    • (2000) IEEE Trans. Electron Devices , vol.47 , pp. 2334-2339
    • Durrani, Z.A.K.1    Irvine, A.C.2    Ahmed, H.3
  • 14
    • 8144220925 scopus 로고    scopus 로고
    • Accurate modeling of quantum-dot based multi-tunnel junction memory
    • C. Le Royer, G. Le Carval, D. Fraboulet, and M. Sanquer, "Accurate modeling of quantum-dot based multi-tunnel junction memory," in Proc. ESSDERC, 2002, pp. 403-406.
    • (2002) Proc. ESSDERC , pp. 403-406
    • Le Royer, C.1    Le Carval, G.2    Fraboulet, D.3    Sanquer, M.4
  • 15
    • 0033169529 scopus 로고    scopus 로고
    • Macromodeling of single electron transistors for efficient circuit simulation
    • Aug
    • Y. S. Yu, S. W. Hwang, and D. Ahn, "Macromodeling of single electron transistors for efficient circuit simulation," IEEE Trans. Electron Devices, vol. 46, pp. 1667-1671, Aug. 1999.
    • (1999) IEEE Trans. Electron Devices , vol.46 , pp. 1667-1671
    • Yu, Y.S.1    Hwang, S.W.2    Ahn, D.3
  • 16
    • 2142662232 scopus 로고    scopus 로고
    • A novel elementary SET negative differential resistance device
    • S. Mahapatra and A. M. Ionescu, "A novel elementary SET negative differential resistance device," Jpn. J. Appl. Phys., pt. 1, vol. 43, no. 2, pp. 538-539, 2004.
    • (2004) Jpn. J. Appl. Phys. , vol.43 , Issue.2 PART 1 , pp. 538-539
    • Mahapatra, S.1    Ionescu, A.M.2
  • 17
    • 0033715104 scopus 로고    scopus 로고
    • Analytical single-electron transistor (SET) model for design and analysis of realistic SET circuits
    • B
    • K. Uchida, K. Matsuzawa, J. Koga, R. Ohba, S. Takagi, and A. Toriumi, "Analytical single-electron transistor (SET) model for design and analysis of realistic SET circuits," Jpn. J. Appl. Phys., pt. 1, vol. 39, no. 4B, pp. 2321-2324, 2000.
    • (2000) Jpn. J. Appl. Phys. , vol.39 , Issue.4 PART 1 , pp. 2321-2324
    • Uchida, K.1    Matsuzawa, K.2    Koga, J.3    Ohba, R.4    Takagi, S.5    Toriumi, A.6
  • 18
    • 0036609870 scopus 로고    scopus 로고
    • A quasianalytical SET model for few electron circuit simulation
    • June
    • S. Mahapatra, A. M. Ionescu, and K. Banerjee, "A quasianalytical SET model for few electron circuit simulation," IEEE Electron Device Lett., vol. 23, pp. 366-368, June 2002.
    • (2002) IEEE Electron Device Lett. , vol.23 , pp. 366-368
    • Mahapatra, S.1    Ionescu, A.M.2    Banerjee, K.3
  • 19
    • 0038394706 scopus 로고    scopus 로고
    • A compact analytical model for asymmetric single-electron transistors
    • Feb
    • H. Inokawa and Y. Takahashi, "A compact analytical model for asymmetric single-electron transistors," IEEE Trans. Electron Devices, vol. 50, pp. 455-461, Feb. 2003.
    • (2003) IEEE Trans. Electron Devices , vol.50 , pp. 455-461
    • Inokawa, H.1    Takahashi, Y.2
  • 20
    • 0348220484 scopus 로고    scopus 로고
    • Simulating hybrid circuits of single-electron transistors and field-effect transistors
    • G. Lientschnig, I. Weymann, and P. Hadley, "Simulating hybrid circuits of single-electron transistors and field-effect transistors," Jpn. J. Appl. Phys., pt. 1, vol. 42, no. 10, pp. 6467-6472, 2003.
    • (2003) Jpn. J. Appl. Phys. , vol.42 , Issue.10 PART 1 , pp. 6467-6472
    • Lientschnig, G.1    Weymann, I.2    Hadley, P.3
  • 22
    • 0346778737 scopus 로고    scopus 로고
    • A CAD framework for co-design and analysis of CMOS-SET hybrid integrated circuits
    • S. Mahapatra et al., "A CAD framework for co-design and analysis of CMOS-SET hybrid integrated circuits," in Proc. ICCAD, 2003, pp. 497-502.
    • (2003) Proc. ICCAD , pp. 497-502
    • Mahapatra, S.1
  • 23
    • 0842285942 scopus 로고    scopus 로고
    • SILVACO Inc.. [Online]. Available
    • SMARTSPICE User Manual. SILVACO Inc.. [Online]. Available: www.silvaco.com
    • SMARTSPICE User Manual
  • 24
    • 0037395540 scopus 로고    scopus 로고
    • Inversion charge liberalization in MOSFET modeling and rigorous derivation of the EKV compact model
    • J. Sallese, M. Bucher, F. Krummenacher, and P. Fazan, "Inversion charge liberalization in MOSFET modeling and rigorous derivation of the EKV compact model," Solid State Electron., vol. 47, pp. 677-683, 2003.
    • (2003) Solid State Electron. , vol.47 , pp. 677-683
    • Sallese, J.1    Bucher, M.2    Krummenacher, F.3    Fazan, P.4
  • 25
    • 8144221476 scopus 로고    scopus 로고
    • New paradigm of predictive MOSFET and interconnect modeling for early circuit design
    • Y. Cao et al., New paradigm of predictive MOSFET and interconnect modeling for early circuit design. presented at Proc. CICC. [Online]. Available: www-device.eecs.berkeley.edu/~ptm
    • Proc. CICC
    • Cao, Y.1
  • 26
    • 0007836179 scopus 로고    scopus 로고
    • Negative differential resistance due to single-electron switching
    • C. P. Heij, D. C. Dixon, P. Hadley, and J. E. Mooij, "Negative differential resistance due to single-electron switching," Appl. Phys. Lett., vol. 74, no. 7, pp. 1042-1044, 1999.
    • (1999) Appl. Phys. Lett. , vol.74 , Issue.7 , pp. 1042-1044
    • Heij, C.P.1    Dixon, D.C.2    Hadley, P.3    Mooij, J.E.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.