Macromodeling of single-electron transistors for efficient circuit simulation

IEEE Transactions on Electron Devices

Volumn 46, Issue 8, 1999, Pages 1667-1671

  Yu, Yun Seop ^a,b   Hwang, Sung Woo ^c   Ahn, Doyeol ^b,c  

^a IEEE   (South Korea)

^b Korea University   (South Korea)

^c University of Seoul   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER SIMULATION; CURRENT VOLTAGE CHARACTERISTICS; DESIGN FOR TESTABILITY; MONTE CARLO METHODS; TRANSISTORS; VLSI CIRCUITS;

CIRCUIT SIMULATION; COMPACT MODELING; SINGLE ELECTRON CIRCUITS; SINGLE ELECTRON TRANSISTORS;

SEMICONDUCTOR DEVICE MODELS;

EID: 0033169529     PISSN: 00189383     EISSN: None     Source Type: Journal    
DOI: 10.1109/16.777155     Document Type: Article

References (13)

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