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Volumn 19, Issue 25, 2008, Pages
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Influence of electron irradiation on the electronic transport mechanisms during the conductive AFM imaging of InAs/GaAs quantum dots capped with a thin GaAs layer
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Author keywords
[No Author keywords available]
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Indexed keywords
ATOMIC FORCE MICROSCOPY;
ATOMIC LAYER EPITAXY;
ATOMIC PHYSICS;
ATOMS;
CHARGE TRAPPING;
CHARGED PARTICLES;
CRYSTAL GROWTH;
DIAMONDS;
ELECTRIC CURRENTS;
ELECTROACUPUNCTURE;
ELECTRON BEAM LITHOGRAPHY;
ELECTRON BEAMS;
ELECTRON IRRADIATION;
ELECTRON MICROSCOPES;
ELECTRON OPTICS;
ELECTRONS;
EPITAXIAL GROWTH;
EXTREME ULTRAVIOLET LITHOGRAPHY;
GALLIUM ALLOYS;
GRAPHIC METHODS;
MECHANISMS;
MICROSCOPES;
MICROSCOPIC EXAMINATION;
MOLECULAR BEAM EPITAXY;
MOLECULAR BEAMS;
MOLECULAR DYNAMICS;
OPTICAL INSTRUMENTS;
OPTICAL WAVEGUIDES;
PARTICLE BEAMS;
PHOSPHORUS;
QUANTUM CHEMISTRY;
QUANTUM ELECTRONICS;
SCANNING;
SCANNING PROBE MICROSCOPY;
SEMICONDUCTING GALLIUM;
SEMICONDUCTOR QUANTUM DOTS;
SIGNAL TRANSDUCTION;
(I ,J) CONDITIONS;
AFM PROBE;
CAP LAYERS;
CONDUCTIVE AFM;
CONDUCTIVE ATOMIC FORCE MICROSCOPE (CAFM);
CONDUCTIVE ATOMIC FORCE MICROSCOPY (C AFM);
ELECTRON PROBING;
ELECTRON-BEAM-INDUCED CURRENT (EBIC);
ELECTRONIC TRANSPORTS;
ENERGY-BAND DIAGRAMS;
FERMI LEVEL PINNING;
GAAS(CSO);
INAS/GAAS QUANTUM DOTS;
MEMORY EFFECTS;
QUANTUM DOTS (QDS);
SCANNING ELECTRON MICROSCOPE (SEM);
SURFACE STATES;
IMAGING TECHNIQUES;
ARSENIC;
CHROMIUM;
COBALT;
DIAMOND;
GALLIUM;
INDIUM;
QUANTUM DOT;
ARTICLE;
ATOMIC FORCE MICROSCOPY;
ELECTRON BEAM;
ELECTRON PROBE MICROANALYSIS;
ELECTRON RADIATION;
ELECTRON TRANSPORT;
ENERGY;
PRIORITY JOURNAL;
SCANNING ELECTRON MICROSCOPY;
SURFACE PROPERTY;
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EID: 44949222446
PISSN: 09574484
EISSN: 13616528
Source Type: Journal
DOI: 10.1088/0957-4484/19/25/255709 Document Type: Article |
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Times cited : (8)
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References (16)
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