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Volumn , Issue , 2011, Pages 503-507

Improving PCM endurance with randomized address remapping in hybrid memory system

Author keywords

Address Remapping; Endurance; Malicious Attack; Phase Change Memory; Security

Indexed keywords

ACCESS TIME; CACHE MECHANISM; HIGH SCALABILITIES; HYBRID MEMORIES; MAIN MEMORY; MALICIOUS ATTACK; PHASE CHANGE; REGION-BASED; REMAPPING; SECURITY; SET ASSOCIATIVE CACHE; STATIC MAPPING; STORAGE CELLS;

EID: 80955167917     PISSN: 15525244     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/CLUSTER.2011.62     Document Type: Conference Paper
Times cited : (6)

References (16)
  • 3
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    • A durable and energy efficient main memory using phase change memory technology
    • P. Zhou, B. Zhao, J. Yang, and Y. Zhang, "A durable and energy efficient main memory using phase change memory technology," in Proceedings of the 36th ISCA, 2009, pp. 14-23.
    • Proceedings of the 36th ISCA, 2009 , pp. 14-23
    • Zhou, P.1    Zhao, B.2    Yang, J.3    Zhang, Y.4
  • 4
    • 77953288543 scopus 로고    scopus 로고
    • A phase change memory as a secure main memory
    • A. Seznec, "A phase change memory as a secure main memory,"IEEE Computer Architecture Letters, vol. 9, pp. 5-8, 2010.
    • (2010) IEEE Computer Architecture Letters , vol.9 , pp. 5-8
    • Seznec, A.1
  • 6
    • 34548825142 scopus 로고    scopus 로고
    • A low power phase-change random access memory using a data-comparison write scheme
    • B.-D. Yang, J.-E. Lee, J.-S. Kim, J. Cho, S.-Y. Lee, and B.-G. Yu, "A low power phase-change random access memory using a data-comparison write scheme," in ISCAS, 2007, pp. 3014-3017.
    • ISCAS, 2007 , pp. 3014-3017
    • Yang, B.-D.1    Lee, J.-E.2    Kim, J.-S.3    Cho, J.4    Lee, S.-Y.5    Yu, B.-G.6
  • 8
    • 0036105871 scopus 로고    scopus 로고
    • Semiconductor memories for IT era
    • C.-G. Hwang, "Semiconductor memories for IT era," in ISSCC, 2002, vol. 1, pp. 24-27.
    • ISSCC, 2002 , vol.1 , pp. 24-27
    • Hwang, C.-G.1
  • 12
    • 77954961189 scopus 로고    scopus 로고
    • Security refresh: Prevent malicious wear-out and increase durability for phase-change memory with dynamically randomized address mapping
    • N. H. Seong, D. H. Woo, and H. S. Lee, "Security refresh: prevent malicious wear-out and increase durability for phase-change memory with dynamically randomized address mapping," in Proceedings of the 37th ISCA, 2010, pp. 383-394.
    • Proceedings of the 37th ISCA, 2010 , pp. 383-394
    • Seong, N.H.1    Woo, D.H.2    Lee, H.S.3
  • 13
    • 76749099329 scopus 로고    scopus 로고
    • Flip-n-write: A simple deterministic technique to improve PRAM write performance, energy and endurance
    • S. Cho and H. Lee, "Flip-n-write: a simple deterministic technique to improve PRAM write performance, energy and endurance," in Proceedings of the 42nd Micro, 2009, pp. 347-357.
    • Proceedings of the 42nd Micro, 2009 , pp. 347-357
    • Cho, S.1    Lee, H.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.