-
1
-
-
0032644091
-
-
Oskam, G.; Vereecken, P. M.; Searson, P. C. J. Electrochem. Soc. 1999, 146, 1436-1441
-
(1999)
J. Electrochem. Soc.
, vol.146
, pp. 1436-1441
-
-
Oskam, G.1
Vereecken, P.M.2
Searson, P.C.3
-
2
-
-
0037502889
-
-
Radisic, A.; Cao, Y.; Taephaisitphongse, P.; West, A. C.; Searson, P. C. J. Electrochem. Soc. 2003, 150, C362-C367
-
(2003)
J. Electrochem. Soc.
, vol.150
-
-
Radisic, A.1
Cao, Y.2
Taephaisitphongse, P.3
West, A.C.4
Searson, P.C.5
-
5
-
-
0031095713
-
-
Dubin, V. M.; Shacham-Diamand, Y.; Zhao, B.; Vasudev, P. K.; Ting, C. H. J. Electrochem. Soc. 1997, 144, 898-908
-
(1997)
J. Electrochem. Soc.
, vol.144
, pp. 898-908
-
-
Dubin, V.M.1
Shacham-Diamand, Y.2
Zhao, B.3
Vasudev, P.K.4
Ting, C.H.5
-
6
-
-
0033640032
-
-
ÖKelly, J. P.; Mongey, K. F.; Gobil, Y.; Torres, J.; Kelly, P. V.; Crean, G. M. Microelectron. Eng. 2000, 50, 473-479
-
(2000)
Microelectron. Eng.
, vol.50
, pp. 473-479
-
-
Ökelly, J.P.1
Mongey, K.F.2
Gobil, Y.3
Torres, J.4
Kelly, P.V.5
Crean, G.M.6
-
7
-
-
0037207680
-
-
Kim, J. J.; Kim, S. K.; Lee, C. H.; Kim, Y. S. J. Vac. Sci. Technol., B 2003, 21, 33-38
-
(2003)
J. Vac. Sci. Technol., B
, vol.21
, pp. 33-38
-
-
Kim, J.J.1
Kim, S.K.2
Lee, C.H.3
Kim, Y.S.4
-
8
-
-
35748951622
-
-
Carraro, C.; Maboudian, R.; Magagnin, L. Surf. Sci. Rep. 2007, 62, 499-525
-
(2007)
Surf. Sci. Rep.
, vol.62
, pp. 499-525
-
-
Carraro, C.1
Maboudian, R.2
Magagnin, L.3
-
9
-
-
67650590961
-
-
Thambidurai, C.; Kim, Y. G.; Jayaraju, N.; Venkatasamy, V.; Stickney, J. L. J. Electrochem. Soc. 2009, 156, D261-D268
-
(2009)
J. Electrochem. Soc.
, vol.156
-
-
Thambidurai, C.1
Kim, Y.G.2
Jayaraju, N.3
Venkatasamy, V.4
Stickney, J.L.5
-
10
-
-
0036573256
-
-
Wu, Y.; Chen, W. C.; Fong, H. P.; Wan, C. C.; Wang, Y. Y. J. Electrochem. Soc. 2002, 149, G309-G317
-
(2002)
J. Electrochem. Soc.
, vol.149
-
-
Wu, Y.1
Chen, W.C.2
Fong, H.P.3
Wan, C.C.4
Wang, Y.Y.5
-
11
-
-
2342646167
-
-
Wang, Z. C.; Li, H. Q.; Shodiev, H.; Suni, I. I. Electrochem. Solid-State Lett. 2004, 7, C67-C69
-
(2004)
Electrochem. Solid-State Lett.
, vol.7
-
-
Wang, Z.C.1
Li, H.Q.2
Shodiev, H.3
Suni, I.I.4
-
12
-
-
0025503278
-
-
Bettelheim, A.; Raveh, A.; Mor, U.; Ydgar, R.; Segal, B. J. Electrochem. Soc. 1990, 137, 3151-3153
-
(1990)
J. Electrochem. Soc.
, vol.137
, pp. 3151-3153
-
-
Bettelheim, A.1
Raveh, A.2
Mor, U.3
Ydgar, R.4
Segal, B.5
-
13
-
-
0042881166
-
-
Rabin, O.; Herz, P. R.; Lin, Y. M.; Akinwande, A. I.; Cronin, S. B.; Dresselhaus, M. S. Adv. Funct. Mater. 2003, 13, 631-638
-
(2003)
Adv. Funct. Mater.
, vol.13
, pp. 631-638
-
-
Rabin, O.1
Herz, P.R.2
Lin, Y.M.3
Akinwande, A.I.4
Cronin, S.B.5
Dresselhaus, M.S.6
-
14
-
-
0037431971
-
-
Choi, J.; Sauer, G.; Nielsch, K.; Wehrspohn, R. B.; Gosele, U. Chem. Mater. 2003, 15, 776-779
-
(2003)
Chem. Mater.
, vol.15
, pp. 776-779
-
-
Choi, J.1
Sauer, G.2
Nielsch, K.3
Wehrspohn, R.B.4
Gosele, U.5
-
15
-
-
18144394726
-
-
Tian, M. L.; Xu, S. Y.; Wang, J. G.; Kumar, N.; Wertz, E.; Li, Q.; Campbell, P. M.; Chan, M. H. W.; Mallouk, T. E. Nano Lett. 2005, 5, 697-703
-
(2005)
Nano Lett.
, vol.5
, pp. 697-703
-
-
Tian, M.L.1
Xu, S.Y.2
Wang, J.G.3
Kumar, N.4
Wertz, E.5
Li, Q.6
Campbell, P.M.7
Chan, M.H.W.8
Mallouk, T.E.9
-
19
-
-
9144227553
-
-
Brevnov, D. A.; Olson, T. S.; Lopez, G. P.; Atanassov, P. J. Phys. Chem. B 2004, 108, 17531-17536
-
(2004)
J. Phys. Chem. B
, vol.108
, pp. 17531-17536
-
-
Brevnov, D.A.1
Olson, T.S.2
Lopez, G.P.3
Atanassov, P.4
-
27
-
-
0000719161
-
-
Lukes, R. M. Plating 1964, 51, 1066-8
-
(1964)
Plating
, vol.51
, pp. 1066-8
-
-
Lukes, R.M.1
-
28
-
-
0032318021
-
-
Vaskelis, A.; Juskenas, R.; Jaciauskiene, J. Electrochim. Acta 1998, 43, 1061-1066
-
(1998)
Electrochim. Acta
, vol.43
, pp. 1061-1066
-
-
Vaskelis, A.1
Juskenas, R.2
Jaciauskiene, J.3
-
30
-
-
80955152681
-
-
ASTM International: West Conshohocken, PA
-
Annual Book of ASTM Standards; ASTM International: West Conshohocken, PA, 2008; Vol. 6.01, p 399.
-
(2008)
Annual Book of ASTM Standards
, vol.601
, pp. 399
-
-
|