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Volumn 6, Issue 8, 2010, Pages 927-931

In situ nanomechanical characterization of single-crystalline boron nanowires by buckling

(7) Lin, Chia Hung a Ni, Hai a Wang, Xinnan a Chang, Ming b Chao, Yuh J a Deka, Juti Rani b Li, Xiaodong a

a University of South Carolina (United States)

b CHUNG YUAN CHRISTIAN UNIVERSITY (Taiwan)

Author keywords

Boron; Buckling; Mechanical properties; Nanomanipulation; Nanowires

Indexed keywords

APPLIED LOADS; BUCKLING BEHAVIORS; CALIBRATION PROCEDURE; IN-SITU; NANO MANIPULATOR; NANOMANIPULATION; NANOMANIPULATIONS; NANOMECHANICAL CHARACTERIZATION; SCANNING ELECTRON MICROSCOPE; SINGLE-CRYSTALLINE;

BORON; BORON COMPOUNDS; CRYSTALLINE MATERIALS; MECHANICAL PROPERTIES; MICROMANIPULATORS; NANOTECHNOLOGY; NANOWIRES; SCANNING ELECTRON MICROSCOPY;

BUCKLING;

BORON; NANOWIRE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CHEMISTRY; CRYSTALLIZATION; MECHANICS; METHODOLOGY; NANOTECHNOLOGY; ULTRASTRUCTURE; YOUNG MODULUS;

BORON; CRYSTALLIZATION; ELASTIC MODULUS; MECHANICAL PHENOMENA; MICROSCOPY, ATOMIC FORCE; NANOTECHNOLOGY; NANOWIRES;

EID: 77951232877 PISSN: 16136810 EISSN: 16136829 Source Type: Journal
DOI: 10.1002/smll.200902087 Document Type: Article

Times cited : (30)

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