Effects of focused ion beam milling on the compressive behavior of directionally solidified micropillars and the nanoindentation response of an electropolished surface

Acta Materialia

Volumn 57, Issue 2, 2009, Pages 503-510

  Shim, S ^c   Bei, H ^a   Miller, M K ^a   Pharr, G M ^a,b   George, E P ^a,b  

^a OAK RIDGE NATIONAL LABORATORY   (United States)

^b University of Tennessee Knoxville   (United States)

^c Research Institute of Industrial Science and Technology (RIST)   (South Korea)

Author keywords

Compression test; Focused ion beam (FIB) damage; Nanoindentation; Plastic deformation; Yield phenomena

Indexed keywords

BEAM PLASMA INTERACTIONS; COMPRESSION TESTING; DEFORMATION; ION BEAMS; ION BOMBARDMENT; IONS; MILLING (MACHINING); MOLYBDENUM; NANOINDENTATION; PLASTIC DEFORMATION; SINGLE CRYSTAL SURFACES;

COMPRESSIVE BEHAVIORS; COMPRESSIVE RESPONSES; CRYSTAL SURFACES; DIRECTIONAL SOLIDIFICATIONS; DIRECTIONALLY SOLIDIFIED; ELECTROPOLISHED; FIB MILLINGS; FOCUSED ION BEAM MILLINGS; GLANCING INCIDENCES; MECHANICAL BEHAVIORS; MICRO PILLARS; SIZE EFFECTS; UNIAXIAL COMPRESSIONS; YIELD PHENOMENA;

FOCUSED ION BEAMS;

EID: 57949092296     PISSN: 13596454     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.actamat.2008.09.033     Document Type: Article

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