Effect of oxygen pressure on the grain and domain structure of polycrystalline 0.85PbMg1/3Nb2/3O3-0. 15PbTiO3 thin films studied by scanning probe microscopy

Journal of Physics D: Applied Physics

Volumn 44, Issue 41, 2011, Pages

  John, Neena S ^a,b   Saranya, D ^b   Parui, Jayanta ^b   Krupanidhi, S B ^b  

^a CENTRE FOR NANO AND SOFT MATTER SCIENCES   (India)

^b INDIAN INSTITUTE OF SCIENCE   (India)

Author keywords

[No Author keywords available]

Indexed keywords

AUTOCORRELATION FUNCTIONS; CORRELATION LENGTHS; DOMAIN STRUCTURE; DOMAIN-WALL PINNING; DYNAMIC CONTACTS; EFFECT OF OXYGEN; ELECTRIC-FIELD-INDUCED SWITCHING; ELECTROSTATIC FORCE MICROSCOPY; GRAIN MORPHOLOGIES; INTERNAL BIAS FIELD; OXYGEN PARTIAL PRESSURE; OXYGEN PRESSURE; PEROVSKITE STRUCTURES; POLAR NANOREGIONS; POLARIZED DOMAIN; POLYCRYSTALLINE;

COBALT COMPOUNDS; CRYSTALS; ELECTRIC FIELDS; ELECTROSTATIC FORCE; MORPHOLOGY; OXYGEN; PEROVSKITE; POLARIZATION; PRESSURE EFFECTS; PULSED LASER DEPOSITION; REGRESSION ANALYSIS; SCANNING ELECTRON MICROSCOPY; SCANNING PROBE MICROSCOPY; SILICON COMPOUNDS; THIN FILMS; X RAY DIFFRACTION;

OXYGEN VACANCIES;

EID: 80053345119     PISSN: 00223727     EISSN: 13616463     Source Type: Journal    
DOI: 10.1088/0022-3727/44/41/415401     Document Type: Article

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