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Volumn 108, Issue 10, 2008, Pages 1081-1085
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Electrostatic force microscopy study on the domain switching properties of the Pb(Zr0.2Ti0.8)O3 thin films with different crystallographic orientations for the probe-based data storage
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Author keywords
Domain; Electrostatic force microscopy; Orientation; Retention
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Indexed keywords
ELECTROSTATIC FORCE;
LEAD ALLOYS;
ZIRCONIUM;
DOMAIN;
DOMAIN SWITCHING;
ELECTROSTATIC FORCE MICROSCOPY;
ORIENTATION;
RETENTION;
LEAD;
LEAD;
MAGNESIUM OXIDE;
PLATINUM;
TITANIUM;
ZIRCONIUM;
ARTICLE;
CRYSTALLOGRAPHY;
MICROSCOPY;
X RAY DIFFRACTION;
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EID: 49949105847
PISSN: 03043991
EISSN: None
Source Type: Journal
DOI: 10.1016/j.ultramic.2008.04.021 Document Type: Article |
Times cited : (4)
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References (15)
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