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Volumn 108, Issue 10, 2008, Pages 1081-1085

Electrostatic force microscopy study on the domain switching properties of the Pb(Zr0.2Ti0.8)O3 thin films with different crystallographic orientations for the probe-based data storage

Author keywords

Domain; Electrostatic force microscopy; Orientation; Retention

Indexed keywords

ELECTROSTATIC FORCE; LEAD ALLOYS; ZIRCONIUM;

EID: 49949105847     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2008.04.021     Document Type: Article
Times cited : (4)

References (15)


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.