Ferroelectric domain configuration and piezoelectric responses in (001)-oriented PMN-PT films

Materials Characterization

Volumn 48, Issue 2-3, 2002, Pages 215-220

  Wang, J ^a   Luo, E Z ^b   Wong, K H ^a   Chan, H L W ^a   Xu, J B ^b   Wilson, I H ^b   Choy, C L ^b  

^a HONG KONG POLYTECHNIC UNIVERSITY   (Hong Kong)

^b CHINESE UNIVERSITY OF HONG KONG   (Hong Kong)

Author keywords

Domain; Ferroelectrics; Films; PMN PT

Indexed keywords

ELECTRODES; LEAD COMPOUNDS; PEROVSKITE; PIEZOELECTRICITY; POLARIZATION; PULSED LASER DEPOSITION; SINGLE CRYSTALS;

PIEZOELECTRIC RESPONSES;

FERROELECTRIC THIN FILMS;

EID: 0036526575     PISSN: 10445803     EISSN: None     Source Type: Journal    
DOI: 10.1016/S1044-5803(02)00242-5     Document Type: Conference Paper

References (10)

1. 3 ferroelectric thin film capacitors
2. Piezoelectric measurements with atomic force microscopy
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6. Domain patterns in epitaxial rhombohedral ferroelectric films: 1. Geometry and experiments
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8. 3 films