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Journal of Applied Physics

Volumn 110, Issue 5, 2011, Pages

Local conductance measurement of graphene layer using conductive atomic force microscopy

(5) Ahmad, Muneer a Han, Sang A a Tien, D Hoang a Jung, Jongwan a Seo, Yongho a

a Sejong University (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; CONDUCTANCE MEASUREMENT; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT PATHS; DOMAIN BOUNDARY; FIELD EMISSION SCANNING ELECTRON MICROSCOPY; GRAPHENE LAYERS; LOW CONDUCTIVITY; MECHANICAL EXFOLIATION; SAMPLE PREPARATION; STEP EDGE;

ATOMIC FORCE MICROSCOPY; CHEMICAL VAPOR DEPOSITION; CONDUCTIVE FILMS; FIELD EMISSION MICROSCOPES; SCANNING ELECTRON MICROSCOPY; SOLVENTS;

GRAPHENE;

EID: 80052957518 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.3626058 Document Type: Conference Paper

Times cited : (49)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.