Local current mapping and patterning of reduced graphene oxide

Journal of the American Chemical Society

Volumn 132, Issue 40, 2010, Pages 14130-14136

  Mativetsky, Jeffrey M ^a   Treossi, Emanuele ^b   Orgiu, Emanuele ^a   Melucci, Manuela ^b,c   Veronese, Giulio Paolo ^c   Samorì, Paolo ^a   Palermo, Vincenzo ^b  

^a UNIVERSITÉ DE STRASBOURG   (France)

^b Istituto per la Sintesi Organica e la Fotoreattività   (Italy)

^c CNR   (Italy)

Author keywords

[No Author keywords available]

Indexed keywords

AFM; AMBIPOLAR TRANSPORT; CONDUCTIVE ATOMIC FORCE MICROSCOPY; CURRENT MAPPING; ELECTRICAL CHARACTERISTIC; ELECTRICAL DISCONTINUITY; ELECTROCHEMICAL REDUCTIONS; GRAPHENE OXIDES; LARGE CURRENT; MICROMETER-SCALE; ORDER OF MAGNITUDE; SINGLE LAYER; TIP-INDUCED; TRANSPARENT ELECTRODE MATERIALS;

ATOMIC FORCE MICROSCOPY; ELECTROCHEMICAL ELECTRODES; ELECTROLYTIC REDUCTION; GRAPHENE; MICROMETERS;

MULTILAYER FILMS;

GRAPHENE; OXIDE;

ARTICLE; ATOMIC FORCE MICROSCOPY; CONDUCTANCE; CONDUCTIVE ATOMIC FORCE MICROSCOPY; ELECTROCHEMISTRY; ELECTRODE; FILM; MATERIALS; RAMAN SPECTROMETRY; SEMICONDUCTOR;

EID: 77957716693     PISSN: 00027863     EISSN: 15205126     Source Type: Journal    
DOI: 10.1021/ja104567f     Document Type: Article

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