Nanoscale conductivity mapping of hybrid nanoarchitectures: Ultrathin poly(o-phenylenediamine) on mesoporous manganese oxide ambigels

Langmuir

Volumn 22, Issue 10, 2006, Pages 4462-4466

  McEvoy, Todd M ^a,c   Long, Jeffrey W ^a   Smith, Timothy J ^b   Stevenson, Keith J ^b  

^a NAVAL RESEARCH LABORATORY   (United States)

^b UNIVERSITY OF TEXAS AT AUSTIN   (United States)

^c AIR PRODUCTS AND CHEMICALS INC   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CONDUCTIVE-PROBE ATOMIC FORCE MICROSCOPY; IMAGE HYBRID ELECTRODE; INDIUM TIN OXIDE (ITO); NANOARCHITECTURES;

ATOMIC FORCE MICROSCOPY; CRYSTAL STRUCTURE; ELECTRIC CONDUCTIVITY; ELECTRODEPOSITION; NANOTECHNOLOGY; SURFACE TOPOGRAPHY; THIN FILMS;

PROBES;

EID: 33744779879     PISSN: 07437463     EISSN: None     Source Type: Journal    
DOI: 10.1021/la052571g     Document Type: Article

References (52)

1. Aricò, A. S.; Bruce, P.; Scrosati, B.; Tarascon, J.-M.; Van Schalkwijk, W. Nat. Mater. 2005, 4, 366.
2. Hirshes, M. Mater. Sci. Eng., B 2004, 108, 1.
3. Rolison, D. R.; Dunn, B. J. Mater. Chem. 2001, 11, 963.
4. Frackowiak, F.; Beguin, F. Carbon 2001, 39, 937.
5. Long, J. W.; Rhodes, C. P.; Young, A. L.; Rolison, D. R. Nano Lett. 2003, 3, 1155.
6. Long, J. W.; Dunn, B.; Rolison, D. R.; White, H. S. Chem. Rev. 2004, 104, 4463.
7. Long, J. W.; Dening, B. M.; McEvoy, T. M.; Rolison, D. R. J. Non-Cryst. Solids 2004, 350, 97.
8. Rhodes, C. P.; Long, J. W.; Doescher, M. S.; Dening, B. M., Rolison, D. R. J. Non-Cryst. Solids 2004, 350, 73.
9. Rhodes, C. P.; Long, J. W.; Doescher, M. S.; Fontanella, J. J.; Rolison, D. R. J. Phys. Chem. B 2004, 108, 13079.
10. Rhodes, C. P.; Long, J. W.; Rolison, D. R. Electrochem. Solid-State Lett. 2005, 8, A579.
11. Long, J. W.; Young, A. L.; Rolison, D. R. J. Electrochem. Soc. 2003, 150, A1161.
12. Pang, S.-C.; Anderson, M. A.; Chapman, T. W. J. Electrochem. Soc. 2000, 147, 444.
13. Pang, S.-C.; Anderson, M. A. J. Mater. Res. 2000, 15, 2096.
14. Chin, S.-F.; Pang, S.-C.; Anderson, M. A. J. Electrochem. Soc. 2002, 149, A379.
15. Lee, H. Y.; Goodenough, J. Solid State Chem. 1999, 144, 220.
16. Toupin, M.; Brousse, T.; Bélanger, D. Chem. Mater. 2004, 16, 3184.
17. Chang, J.-K.; Tsai, W.-T. J. Electrochem. Soc. 2003, 150, A1333.
18. Hu, C.-C; Tou, T.-W. J. Power Sources 2003, 115, 179.
19. Lee, H. Y.; Kim, S. W.; Lee, H. Y. Electrochem. Solid-State Lett. 2001, 4, A19.
20. Zheng, J. P.; Jow, T. R. J. Electrochem. Soc. 1995, 142, 2699.
21. Zheng, J. P.; Cygan, P. J.; Jow, T. R. J. Electrochem. Soc. 1995, 142, L6.
22. Burke, L. D.; Murphy, O. J.; O'Neill, J. F.; Venkatesan, S. J. Chem. Soc., Faraday Trans. 1977, 73, 1659.
23. Bakardjieva, S.; Bezdicka, P.; Grygar, T.; Vorm, P. J. Solid State Electrochem. 2000, 4, 306.
24. Lee, J. A.; Maskell, W. C.; Tye, F. L. J. Electroanal. Chem. 1977, 79, 79.
25. Maskell, W. C. J. Electroanal. Chem. 1985, 198, 127.
26. Lee, J. A.; Maskell, W. C.; Tye, F. L. J. Electroanal. Chem. 1980, 110, 145.
27. Burgmayer, P.; Murray, R. W. J. Phys. Chem. 1984, 88, 2515.
28. Feldman, B. J.; Burgmayer, P.; Murray, R. W. J. Am. Chem. Soc. 1985, 107, 872.
29. Burgmayer, P.; Murray, R. W. J. Am. Chem. Soc. 1982, 104, 6139.
30. Pellegrino, J. Ann. N.Y. Acad. Sci. 2003, 984, 289.
31. See Electrical Characterization with Scanning Probe Microscopies, Application Note no. 79, Veeco Metrology; http://www.veeco.com/appnotes/ AN79_ElecChar_RevA0.pdf
32. De Wolf, P.; Snauwaert, J.; Clarysse, T.; Vandervorst, W.; Hellemans, L. Appl. Phys. Lett. 1995, 66, 1530.
33. Ravier, J.; Houzé, R.; Carmona, F.; Schneegans, O.; Saadaoui, H. Carbon 2001, 39, 314.
34. Boxley, C. J.; White, H. S.; Gardner, C. E.; Macpherson, J. V. J. Phys. Chem. B 2003, 107, 9677.
35. Loiacono, M. J.; Granstrom, E. L.; Frisbie, C. D. J. Phys. Chem. B 1998, 102, 1679.
36. Park, J. G.; Lee, S. H.; Kim, B.; Park, Y. W. Appl. Phys. Lett. 2002, 81, 4625.
37. Viswanathan, R.; Heaney, M. B. Phys. Rev. Lett. 1995, 75, 4433.
38. Luo, E. Z.; Ma, J. X.; Xu, J. B.; Wilson, I. H.; Pakhomov, A. B.; Yan, X. J. Phys. D.; Appl. Phys. 1996, 29, 3169.
39. McEvoy, T. M.; Stevenson, K. J. Langmuir 2005, 21, 3521.
40. Pomarico, A. A.; Huang, D.; Dickinson, J.; Baski, A. A.; Cingolani, R.; Morkoc, H.; Molnar, R. Appl. Phys. Lett. 2003, 83, 1890.
41. Bockrath, M.; Markovic, N.; Shepard, A.; Tinkham, M.; Gurevich, L.; Kouwenhoven, L. P. Wu, M. W.; Sohn, L. L. Nano Lett. 2002, 2, 187.
42. Cai, L.; Tabata, H.; Kawai, T. Nanotechnology 2001, 12, 211.
43. Han, D.-H.; Park, S.-M. J. Phys. Chem. B 2004, 108, 13921.
44. Lee, H. J.; Park, S.-M. J. Phys. Chem. B 2004, 108, 16365.
45. Hong, S.-Y.; Park, S.-M. J. Phys. Chem. B 2005, 109, 9305.
46. Long, J. W.; Qadir, L. R.; Stroud, R. M.; Rolison, D. R. J. Phys. Chem. B 2001, 105, 8712.
47. Kostecki, R.; McLarnon, F. Appl. Phys. Lett. 2000, 76, 2535.
48. Long, J. W.; Stroud, R. M.; Rolison, D.R. J. Non-Cryst. Solids 2001, 285, 288.
49. Hamberg, I.; Granquist, C. G. J. Appl. Phys. 1986, 60, R123.
50. De Guzman, R. N.; Awaluddin, A.; Shen, Y.-F.; Tian, Z. R.; Suib, S. L.; Ching, S.; O'Young, C.-L. Chem. Mater. 1995, 7, 1286.
51. Prasad, B. M.; Singh, D.; Misra, R. A. J. Polym. Mater. 1996, 13, 157.
52. Current originating from nanometer-sized pinholes would be measurable, although correlation to specific structural features would be difficult because features smaller than the tip become convoluted by the shape of the probe (tip radius of 35 nm).