Comparison of frictional forces on graphene and graphite

Nanotechnology

Volumn 20, Issue 32, 2009, Pages

  Lee, Hyunsoo ^a   Lee, Naesung ^a   Seo, Yongho ^a   Eom, Jonghwa ^a   Lee, Sangwook ^b  

^a Sejong University   (South Korea)

^b Konkuk University   (South Korea)

Author keywords

[No Author keywords available]

Indexed keywords

ATTRACTIVE FORCE; FORCE SPECTROSCOPY; FRICTIONAL FORCES; GRAPHENES; LATERAL FORCE MICROSCOPY; NORMAL FORCES; SI OXIDE; SI WAFER; STICK-SLIP EFFECT; THERMALLY ACTIVATED; VAN DER WAALS INTERACTIONS;

FRICTION; SEMICONDUCTING SILICON COMPOUNDS; SILICON NITRIDE; SILICON OXIDES; SILICON WAFERS; SLIP FORMING; TRIBOLOGY; VAN DER WAALS FORCES;

GRAPHITE;

GRAPHENE; GRAPHITE; SILICON DIOXIDE; SILICON NITRIDE;

ARTICLE; COMPARATIVE STUDY; CONTROLLED STUDY; FORCE; FRICTION; MICROSCOPY; PRIORITY JOURNAL; RAMAN SPECTROMETRY; SURFACE PROPERTY; THICKNESS;

EID: 70249114069     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/32/325701     Document Type: Article

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