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Volumn 108, Issue 6, 2008, Pages 514-522

A quantitative analysis of the cone-angle dependence in precession electron diffraction

Author keywords

Bulk charge density; Kinematical extinction; Multislice simulation; Precession electron diffraction

Indexed keywords

ANGLE MEASUREMENT; ELECTRON DIFFRACTION; KINEMATICS; PROBLEM SOLVING;

EID: 41949136654     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.08.004     Document Type: Article
Times cited : (33)

References (42)
  • 14
    • 41949127716 scopus 로고    scopus 로고
    • M. Saunders, P.A. Midgley, R. Vincent, in: Electron Microscopy and Analysis, vol. 147, 1995, p. 125.
    • M. Saunders, P.A. Midgley, R. Vincent, in: Electron Microscopy and Analysis, vol. 147, 1995, p. 125.
  • 32
    • 41949120122 scopus 로고    scopus 로고
    • R. Kilaas, C.S. Own, B. Deng, et al., EDM: Electron Direct Methods: Documentation-2.0.1, 〈http://www.numis.northwestern.edu/edm/documentation/edm.htm〉, (2006).
    • R. Kilaas, C.S. Own, B. Deng, et al., EDM: Electron Direct Methods: Documentation-2.0.1, 〈http://www.numis.northwestern.edu/edm/documentation/edm.htm〉, (2006).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.