Dislocation electron tomography and precession electron diffraction - Minimising the effects of dynamical interactions in real and reciprocal space

Philosophical Magazine

Volumn 90, Issue 35-36, 2010, Pages 4711-4730

  Barnard, J S ^a   Eggeman, A S ^a   Sharp, J ^a   White, T A ^a   Midgley, P A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

Author keywords

dislocation structure; electron diffraction; precession electron diffraction; STEM; tomography; transmission electron microscopy; weak beam imaging

Indexed keywords

BEAM IMAGING; DISLOCATION STRUCTURES; PRECESSION ELECTRON DIFFRACTION; STEM; TRANSMISSION ELECTRON;

DATA PROCESSING; ELECTRIC IMPEDANCE TOMOGRAPHY; ELECTRON DIFFRACTION; ELECTRONS; IMAGE PROCESSING; TRANSMISSION ELECTRON MICROSCOPY;

AMORPHOUS MATERIALS;

EID: 77958568523     PISSN: 14786435     EISSN: 14786443     Source Type: Journal    
DOI: 10.1080/14786430903581338     Document Type: Conference Paper

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