3D characterization and metrology of nanostructures by electron tomography

Microscopy and Microanalysis

Volumn 14, Issue SUPPL. 2, 2008, Pages 284-285

  Hernandez, J C ^a,b   Hungria, A B ^a,b   Perez Omil, J A ^b   Moreno, M S ^c   Coronado, E A ^d   Cempura, G ^e   Kruk, A ^e   Midgley, P A ^a  

^a UNIVERSITY OF CAMBRIDGE   (United Kingdom)

^b UNIVERSITY OF CÁDIZ   (Spain)

^c CENTRO ATÓMICO BARILOCHE   (Argentina)

^d DEPARTAMENTO DE FISICOQUÍMICA   (Argentina)

^e AGH UNIVERSITY OF SCIENCE AND TECHNOLOGY   (Poland)

Author keywords

[No Author keywords available]

Indexed keywords

EID: 49549104645     PISSN: 14319276     EISSN: 14358115     Source Type: Journal    
DOI: 10.1017/S1431927608087394     Document Type: Conference Paper

References (5)

1. S.E. Habas et al., Nature 448 (2007) 108.
2. P.A. Midgley and M. Weyland, Ultramicroscopy 96 (3-4) (2003) 413.
3. K.L. Kelly et al., J. Phys. Chem. B 107 (2003) 668.
4. J.C. Hernandez et al., J.Phys.Chem.C 111 (26) (2007) 9001.
5. The authors acknowledge financial support from the European Union under the Framework 6 program for an Integrated Infrastructure Initiative. Ref.: 026019 ESTEEM. The aid of Dr J.J. Calvino is gratefully acknowledged. Ezequiel R. Encina (Univ.Nac.Cordoba) is thanked for the preparation of the Au nanoparticles. Support of CONICET and ANPCyT, Argentina is also acknowledged.