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Volumn 55, Issue 4, 2008, Pages 2148-2153

Qualification methodology for sub-micron ICs at the low noise underground laboratory of rustrel

Author keywords

Alpha contamination; Field programmable gate array (FPGA); Low noise; Real time testing; SER; Underground test

Indexed keywords

ALPHA CONTAMINATION; FIELD-PROGRAMMABLE GATE ARRAY (FPGA); LOW NOISE; REAL TIME TESTING; SER; UNDERGROUND TEST;

EID: 53349089728     PISSN: 00189499     EISSN: None     Source Type: Journal    
DOI: 10.1109/TNS.2008.2000863     Document Type: Conference Paper
Times cited : (16)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.