Carrier mobility in pentacene as a function of grain size and orientation derived from scanning transmission X-ray microscopy

Organic Electronics

Volumn 12, Issue 11, 2011, Pages 1936-1942

  Bräuer, Björn ^a   Kukreja, Roopali ^a   Virkar, Ajay ^b   Akkerman, Hylke B ^b   Fognini, Andreas ^d   Tyliszczak, Tolek ^c   Bao, Zhenan ^b  

^a STANFORD UNIVERSITY   (United States)

^b Stanford University   (United States)

^c LAWRENCE BERKELEY NATIONAL LABORATORY   (United States)

^d ETH ZURICH   (Switzerland)

Author keywords

Grain; Pentacene; STXM; X ray microscopy

Indexed keywords

ATOMIC FORCE MICROSCOPY; CARRIER MOBILITY; GRAIN (AGRICULTURAL PRODUCT); GRAIN SIZE AND SHAPE; ORGANIC POLYMERS; SELF ASSEMBLED MONOLAYERS; SILICON NITRIDE; SURFACE ROUGHNESS; X RAY MICROSCOPES; X RAYS;

GRAIN ORIENTATION; IN-PLANE ORIENTATION; PENTACENE FIELD EFFECT TRANSISTORS; PENTACENES; SCANNING TRANSMISSION X RAY MICROSCOPY; SILICON NITRIDE MEMBRANE; STXM; X RAY MICROSCOPY;

FIELD EFFECT TRANSISTORS;

EID: 80052679449     PISSN: 15661199     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.orgel.2011.08.007     Document Type: Article

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