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Volumn 22, Issue 12, 2010, Pages 3693-3697

X-ray microscopy imaging of the grain orientation in a pentacene field-effect transistor

Author keywords

[No Author keywords available]

Indexed keywords

CHANNEL REGION; CONDUCTING ELECTRODES; ELECTRONIC TRANSPORT; GRAIN ORIENTATION; GRAIN SIZE; IN-PLANE ORIENTATION; NANOMETER LENGTH SCALE; ORGANIC SEMICONDUCTOR THIN FILMS; PENTACENES; SCANNING TRANSMISSION X RAY MICROSCOPY; X RAY MICROSCOPY;

EID: 77953626414     PISSN: 08974756     EISSN: 15205002     Source Type: Journal    
DOI: 10.1021/cm100487j     Document Type: Article
Times cited : (40)

References (47)
  • 27
    • 35148889033 scopus 로고    scopus 로고
    • Springer-Verlag: Berlin, Heidelberg
    • Stöhr, J.; Siegmann, H. C. Magnetism; Springer-Verlag: Berlin, Heidelberg, 2006.
    • (2006) Magnetism
    • Stöhr, J.1    Siegmann, H.C.2
  • 41
    • 77953649049 scopus 로고    scopus 로고
    • this is a publication of a national laboratory, available on line at
    • Fink, R.; Groh, U.; Meigs, G.; Ade, H. Advanced Light Source Compendium of User Abstracts. 2000; this is a publication of a national laboratory, available on line at http://www.als.lbl.gov/als/compendium/AbstractManager/ uploads/00172.pdf.
    • (2000) Advanced Light Source Compendium of User Abstracts
    • Fink, R.1    Groh, U.2    Meigs, G.3    Ade, H.4


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.