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Volumn 20, Issue 23, 2010, Pages 4884-4887
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In situ STXM investigations of pentacene-based OFETs during operation
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Author keywords
[No Author keywords available]
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Indexed keywords
ELECTRONIC PERFORMANCE;
HIGH VACUUM;
IN-SITU;
PENTACENES;
SILICON NITRIDE MEMBRANE;
SPECTRAL CHANGE;
ULTRA-THIN;
ELECTRONIC PROPERTIES;
ELECTRONIC STRUCTURE;
ORGANIC FIELD EFFECT TRANSISTORS;
SEMICONDUCTING ORGANIC COMPOUNDS;
SILICON NITRIDE;
SPECTROSCOPY;
FIELD EFFECT TRANSISTORS;
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EID: 77952986520
PISSN: 09599428
EISSN: 13645501
Source Type: Journal
DOI: 10.1039/c0jm00423e Document Type: Article |
Times cited : (26)
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References (30)
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