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Volumn 84, Issue 8, 2011, Pages

Identification of the VAl-ON defect complex in AlN single crystals

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EID: 80052492217     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.84.081204     Document Type: Article
Times cited : (68)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.