Epitaxial TiN(001) wetting layer for growth of thin single-crystal Cu(001)

Journal of Applied Physics

Volumn 110, Issue 4, 2011, Pages

  Chawla, J S ^a   Zhang, X Y ^a   Gall, D ^a  

^a RENSSELAER POLYTECHNIC INSTITUTE   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON TRANSPORT MEASUREMENTS; IN-SITU; LOW TEMPERATURES; SPECULAR SCATTERING; SPECULARITIES; ULTRA-THIN; WETTING LAYER;

DEFECT DENSITY; EPITAXIAL GROWTH; SURFACE ROUGHNESS; WETTING; X RAY DIFFRACTION;

TITANIUM NITRIDE;

EID: 80052422217     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.3624773     Document Type: Article

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