Simulation of grain boundary effects on electronic transport in metals, and detailed causes of scattering

Physica Status Solidi (B) Basic Research

Volumn 247, Issue 7, 2010, Pages 1791-1796

  Feldman, Baruch ^a,b,d   Park, Seongjun ^a   Haverty, Michael ^a   Shankar, Sadasivan ^a   Dunham, Scott T ^b,c  

^a INTEL CORPORATION   (United States)

^b UNIVERSITY OF WASHINGTON   (United States)

^c University of Washington   (United States)

^d UNIVERSITY COLLEGE CORK   (Ireland)

Author keywords

Electronic conduction; First principles; Grain boundaries; metals; Scattering

Indexed keywords

EID: 77954605653     PISSN: 03701972     EISSN: 15213951     Source Type: Journal    
DOI: 10.1002/pssb.201046133     Document Type: Article

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