Control of the principal refractive indices in biaxial metal oxide films

Journal of the Optical Society of America A: Optics and Image Science, and Vision

Volumn 28, Issue 9, 2011, Pages 1830-1840

  Wakefield, Nicholas G ^a   Sorge, Jason B ^a   Taschuk, Michael T ^a   Bezuidenhout, Louis W ^a   Brett, Michael J ^a,b   Sit, Jeremy C ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

BIREFRINGENCE; DEPOSITION; LIGHT REFRACTION; METALLIC COMPOUNDS; REFRACTIVE INDEX; REFRACTOMETERS;

COLUMNAR THIN FILMS; COMMON MATERIALS; DEPOSITION ANGLE; EXPERIMENTAL CHARACTERIZATION; GLANCING ANGLE DEPOSITION; IN-PLANE BIREFRINGENCE; METAL OXIDE FILM; METAL OXIDES; SUBSTRATE ROTATION; UNIFIED FRAMEWORK;

OXIDE FILMS;

EID: 80052325342     PISSN: 10847529     EISSN: 15208532     Source Type: Journal    
DOI: 10.1364/JOSAA.28.001830     Document Type: Article

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