Coupled defects in one-dimensional photonic crystal films fabricated with glancing angle deposition

Optics Express

Volumn 18, Issue 12, 2010, Pages 13220-13226

  Hawkeye, Matthew M ^a   Joseph, Robert ^a   Sit, Jeremy C ^a   Brett, Michael J ^a,b  

^a UNIVERSITY OF ALBERTA   (Canada)

^b NATIONAL RESEARCH COUNCIL CANADA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTAL DEFECTS; FABRICATION; LIGHT REFRACTION; MICROCOMPUTERS; NANOSTRUCTURES; PHOTONIC CRYSTALS; REFRACTIVE INDEX; REFRACTOMETERS;

COUPLED DEFECTS; DEFECT INTERACTIONS; DEFECT SEPARATION; DEVICE FABRICATIONS; FILM NANOSTRUCTURES; GLANCING ANGLE DEPOSITION; GLANCING ANGLE DEPOSITION TECHNIQUE; ID PHOTONIC CRYSTALS; INTERACTION STRENGTH; ONE DIMENSIONAL PHOTONIC CRYSTAL; PLATFORM TECHNOLOGY; REFRACTIVE INDEX PROFILES; REFRACTIVE INDEX VARIATIONS; TWO PHASE;

OPTICAL FILMS;

EID: 77953606331     PISSN: None     EISSN: 10944087     Source Type: Journal    
DOI: 10.1364/OE.18.013220     Document Type: Article

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