Effect of sample thickness, energy filtering, and probe coherence on fluctuation electron microscopy experiments

Ultramicroscopy

Volumn 111, Issue 8, 2011, Pages 1375-1380

  Yi, Feng ^a   Voyles, P M ^a  

^a Wisconsin Electric Machines and Power Electronics Consortium   (United States)

Author keywords

Coherence; Energy filter; Fluctuation electron microscopy; Nanodiffraction; Shot noise; Thickness

Indexed keywords

ENERGY FILTER; ENERGY FILTERING; FLUCTUATION ELECTRON MICROSCOPIES; NANODIFFRACTION; SAMPLE THICKNESS; SPATIAL FLUCTUATION; THICKNESS;

EXPERIMENTS; PROBES;

ELECTRON MICROSCOPY;

ARTICLE; CONTROLLED STUDY; DIGITAL FILTERING; ELASTICITY; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; ENERGY FILTERED TRANSMISSION ELECTRON MICROSCOPY; FLUCTUATION ELECTRON MICROSCOPY; IMAGING SYSTEM; INTERMETHOD COMPARISON; LIGHT SCATTERING; MATHEMATICAL MODEL; MOLECULAR PROBE; NANOANALYSIS; PREDICTION; QUANTITATIVE ANALYSIS; RELIABILITY; SIGNAL PROCESSING; THICKNESS;

EID: 80051814118     PISSN: 03043991     EISSN: 18792723     Source Type: Journal    
DOI: 10.1016/j.ultramic.2011.05.004     Document Type: Article

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