Nanometer-scale order in amorphous Ge2Sb2Te 5 analyzed by fluctuation electron microscopy

Applied Physics Letters

Volumn 90, Issue 2, 2007, Pages

  Kwon, Min Ho ^a   Lee, Bong Sub ^e   Bogle, Stephanie N ^e   Nittala, Lakshmi N ^e   Bishop, Stephen G ^e   Abelson, John R ^b   Raoux, Simone ^c   Cheong, Byung Ki ^d   Kim, Ki Bum ^a  

^a Seoul National University   (South Korea)

^b University of Illinois at Urbana Champaign   (United States)

^c IBM ALMADEN RESEARCH CENTER   (United States)

^d Korea Institute of Science and Technology   (South Korea)

^e NONE

Author keywords

[No Author keywords available]

Indexed keywords

CRYSTALLIZATION THRESHOLD; FLUCTUATION ELECTRON MICROSCOPY;

AMORPHOUS MATERIALS; CRYSTALLIZATION; ELECTRON MICROSCOPES; GERMANIUM COMPOUNDS; NONVOLATILE STORAGE; THIN FILMS;

NANOSTRUCTURED MATERIALS;

EID: 33846233834     PISSN: 00036951     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2430067     Document Type: Article

References (21)

1. M. Wuttig, in Nanoelectronics and Information Technology, edited by, R. Waser, (Wiley, Weinheim, 2005), 2nd ed., p. 645.
2. M. Wuttig, Nat. Mater. 4, 265 (2005).
3. V. Weidenhof, I. Friedrich, S. Ziegler, and M. Wuttig, J. Appl. Phys. 89, 3168 (2001).
4. J. H. Coombs, A. P. J. M. Jongenelis, W. van Es-Spiekman, and B. A. J. Jacobs, J. Appl. Phys. 78, 4906 (1995).
5. J. Park, M. R. Kim, W. S. Choi, H. Seo, and C. Yeon, Jpn. J. Appl. Phys., Part 1 38, 4775 (1999).
6. M. Naito, M. Ishimaru, Y. Hirotsu, and M. Takashima, Jpn. J. Appl. Phys., Part 2 42, L1158 (2003).
7. M. Naito, M. Ishimaru, Y. Hirotsu, and M. Takashima, J. Non-Cryst. Solids 345-346, 112 (2004).
8. M. Naito, M. Ishimaru, Y. Hirotsu, and M. Takashima, J. Appl. Phys. 95, 8130 (2004).
9. G.-S. Park, H.-C. Hong, J.-M. Yang, and D. Shindo, J. Electron Microsc. 48, 183 (1999).
10. O. L. Krivanek, P. H. Gaskell, and A. Howie, Nature (London) 262, 454 (1976).
11. M. M. J. Treacy, J. M. Gibson, L. Fan, D. J. Paterson, and I. McNulty, Rep. Prog. Phys. 68, 2899 (2005).
12. P. M. Voyles and J. R. Abelson, Sol. Energy Mater. Sol. Cells 78, 85 (2003).
13. P. M. Voyles and D. A. Muller, Ultramicroscopy 93, 147 (2002).
14. M. M. J. Treacy and J. M. Gibson, Acta Crystallogr., Sect. A: Found. Crystallogr. A52, 212 (1996).
15. J. M. Gibson and M. M. J. Treacy, Phys. Rev. Lett. 78, 1074 (1997).
16. J. E. Gerbi, P. M. Voyles, M. M. J. Treacy, J. M. Gibson, and J. R. Abelson, Appl. Phys. Lett. 82, 3665 (2003).
17. J. M. Gibson, M. M. J. Treacy, and P. M. Voyles, Ultramicroscopy 83, 169 (2000).
18. P. M. Voyles, Ph.D. thesis, University of Illinois at Urbana-Champaign, 2001.
19. P. M. Voyles, J. E. Gerbi, M. M. J. Treacy, J. M. Gibson, and J. R. Abelson, Phys. Rev. Lett. 86, 5514 (2001).
20. L. N. Nittala, S. Jayaraman, B. A. Sperling, and J. R. Abelson, Appl. Phys. Lett. 87, 241915 (2005).
21. J. K. Bording and J. Tafto, Phys. Rev. B 62, 8098 (2000).