A phenomenological model of fluctuation electron microscopy for a nanocrystal/amorphous composite

Ultramicroscopy

Volumn 108, Issue 8, 2008, Pages 727-736

  Stratton, W G ^a   Voyles, P M ^a  

^a University of Wisconsin Madison   (United States)

Author keywords

Amorphous materials; Fluctuation electron microscopy; Glass; Medium range order

Indexed keywords

ALUMINUM; CARBON NANOTUBES; CHARGED PARTICLES; ELECTRON MICROSCOPES; ELECTRON MICROSCOPY; ELECTRON OPTICS; ELECTRON SPECTROSCOPY; ELECTRONS; FINITE ELEMENT METHOD; IMAGING TECHNIQUES; MATERIALS SCIENCE; MATHEMATICAL MODELS; MICROSCOPES; MICROSCOPIC EXAMINATION; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURES; NANOTECHNOLOGY; PIGMENTS; VOLUME FRACTION;

(P ,P ,T) MEASUREMENTS; FLUCTUATION ELECTRON MICROSCOPY (FEM); MEDIUM-RANGE ORDER (MRO); NANO CRYSTALS; NANOCRYSTAL SIZES; NANODIFFRACTION; PHENOMENOLOGICAL MODELING; QUANTITATIVE ELECTRON MICROSCOPY; REAL-SPACE RESOLUTION; SAMPLE THICKNESS; SPATIAL FLUCTUATIONS; VECTOR MAGNITUDE;

AMORPHOUS MATERIALS;

NANOCRYSTAL;

ARTICLE; CRYSTAL STRUCTURE; ELECTRON DIFFRACTION; ELECTRON MICROSCOPY; FLUCTUATION ELECTRON MICROSCOPY; IMAGE ANALYSIS; IMAGE QUALITY; NANOANALYSIS; SCANNING ELECTRON MICROSCOPY; TRANSMISSION ELECTRON MICROSCOPY;

EID: 45449087954     PISSN: 03043991     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.ultramic.2007.11.004     Document Type: Article

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