Fluctuation X-ray microscopy: A novel approach for the structural study of disordered materials

Journal of Microscopy

Volumn 225, Issue 1, 2007, Pages 41-48

  Fan, L ^a   Paterson, D ^c   McNulty, I ^a   Treacy, M M J ^b   Gibson, J M ^a  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c AUSTRALIAN SYNCHROTRON   (Australia)

Author keywords

Coherent scattering; Disordered materials; Fluctuation X ray microscopy; Medium range order; Speckle

Indexed keywords

COHERENT SCATTERING; MAGNETIC MATERIALS; SEMICONDUCTOR QUANTUM DOTS; SPECKLE;

COHERENT X-RAYS; CORRELATION LENGTHS; DISORDERED MATERIALS; FLUCTUATION X-RAY MICROSCOPY; LARGE LENGTH-SCALE; MEDIUM RANGE; MEDIUM RANGE ORDER; NANOMETRES; SPECKLE; STRUCTURAL STUDIES;

SHOT NOISE;

ARTICLE; CORRELATION ANALYSIS; DATA ANALYSIS; ILLUMINATION; PRIORITY JOURNAL; QUANTITATIVE ANALYSIS; X RAY; X RAY MICROANALYSIS;

EID: 33846797812     PISSN: 00222720     EISSN: 13652818     Source Type: Journal    
DOI: 10.1111/j.1365-2818.2007.01714.x     Document Type: Article

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