Substantial crystalline topology in amorphous silicon

Physical Review Letters

Volumn 105, Issue 12, 2010, Pages

  Gibson, J M ^a   Treacy, M M J ^b,c   Sun, T ^a   Zaluzec, N J ^d  

^a ARGONNE NATIONAL LABORATORY   (United States)

^b ARIZONA STATE UNIVERSITY   (United States)

^c UNIVERSITY OF OXFORD   (United Kingdom)

^d ARGONNE NATIONAL LABORATORY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS SILICON FILM; CORRELATION LENGTHS; CRYSTALLINE ORDERING; CRYSTALLINITIES; FLUCTUATION ELECTRON MICROSCOPIES; NANODIFFRACTION PATTERNS;

AMORPHOUS FILMS; COMPUTER SIMULATION; CRYSTALLINE MATERIALS; TOPOLOGY;

AMORPHOUS SILICON;

EID: 77957118524     PISSN: 00319007     EISSN: 10797114     Source Type: Journal    
DOI: 10.1103/PhysRevLett.105.125504     Document Type: Article

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