Damp-heat degradation and repair of oxide-passivated silicon

Physica Status Solidi (A) Applications and Materials Science

Volumn 208, Issue 8, 2011, Pages 1931-1936

  McIntosh, Keith R ^a   Dai, Xi ^a  

^a AUSTRALIAN NATIONAL UNIVERSITY   (Australia)

Author keywords

degradation; humidity; passivation; silicon; SiO 2

Indexed keywords

DAMP-HEAT EXPOSURE; FRONT SURFACES; HIGH-EFFICIENCY SOLAR CELLS; RELIABILITY TESTING; SIO 2; SURFACE RECOMBINATION VELOCITIES;

DEGRADATION; EXPERIMENTS; PASSIVATION; PHOSPHORUS; SILICON; SILICON COMPOUNDS; SURFACE TESTING;

SILICON OXIDES;

EID: 80051682088     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.201026492     Document Type: Article

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