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Volumn 68, Issue 15, 1996, Pages 2076-2078
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Passivation of Pb0 and Pb1 interface defects in thermal (100) Si/SiO2 with molecular hydrogen
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Author keywords
[No Author keywords available]
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Indexed keywords
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EID: 11544321991
PISSN: 00036951
EISSN: None
Source Type: Journal
DOI: 10.1063/1.116308 Document Type: Article |
Times cited : (136)
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References (17)
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