Proposed triaxial atomic force microscope contact-free tweezers for nanoassembly

Nanotechnology

Volumn 20, Issue 38, 2009, Pages

  Brown, Keith A ^a   Westervelt, Robert M ^a  

^a HARVARD UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPES; BIOLOGICAL MOLECULE; CONTROLLED ASSEMBLY; DIELECTROPHORESIS; NANO SCALE; NANO-ASSEMBLIES; NANOPARTICLE SIZES; PICK-AND-PLACE; ROOM TEMPERATURE; SEMICONDUCTOR NANOPARTICLES; SEMICONDUCTOR NANOWIRE; SILICON NANOPARTICLES; SINGLE NANOPARTICLE; SINGLE PARTICLE; SPATIAL ACCURACY; TRAPPING ENERGY;

CARBON NANOTUBES; ELECTRIC WIRE; ELECTROPHORESIS; SEMICONDUCTOR QUANTUM DOTS; VAN DER WAALS FORCES;

NANOPARTICLES;

NANOPARTICLE; QUANTUM DOT; SILICON; WATER;

ARTICLE; ATOMIC FORCE MICROSCOPY; ELECTRIC FIELD; ELECTRODE; ELECTROPHORESIS; ENERGY; FORCE; MICROSCOPE; NANOANALYSIS; PARTICLE SIZE; PRIORITY JOURNAL; RADIUS; ROOM TEMPERATURE; SEMICONDUCTOR; SURFACE PROPERTY; ALGORITHM; CHEMISTRY; ELECTROMAGNETIC FIELD; EQUIPMENT DESIGN; INSTRUMENTATION; METHODOLOGY; NANOTECHNOLOGY;

ALGORITHMS; ELECTROMAGNETIC PHENOMENA; EQUIPMENT DESIGN; MICROSCOPY, ATOMIC FORCE; NANOPARTICLES; NANOTECHNOLOGY; QUANTUM DOTS;

EID: 70349129595     PISSN: 09574484     EISSN: 13616528     Source Type: Journal    
DOI: 10.1088/0957-4484/20/38/385302     Document Type: Article

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